spmi.1998.0581

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Quantitative interface roughness analysis of Fe/Cr superlattices

pp. 239-247 (doi:10.1006/spmi.1998.0581)

R. Schad ^*, P. Belien , G. Verbanck, K. Temst, V. V. Moshchalkov, Y. Bruynseraede, H. Fischer, S. Lefebvre^§, M. Bessiere^§, D. Bahr^¶, J. Falta^¶, J. Dekoster, G. Langouche

^*Research Institute for Materials, KU Nijmegen, ED Nijmegen, NL - 6525, The Netherlands
Laboratorium voor Vaste-Stoffysika en Magnetisme, K.U.Leuven, Leuven, B-3001, Belgium
Inst. Laue Langevin, Grenoble cedex 9, 38042, France
^§L.U.R.E., Universite de Paris-Sud, Orsay cedex, 91405, France
^¶Hamburger Synchrotronstrahlungslabor at DESY, Notkestr. 85, Hamburg, 22607, Germany
Instituut voor Kern- en Stralenfisika, K.U.Leuven, Leuven, 3001, Belgium

(Received 5 May 1998)

Abstract

The quantitative characterization of the interface roughness of Fe/Cr superlattices is necessary for the understanding of the transport properties of such structures. This must include both vertical and lateral roughness components. The information can be obtained by specular and off-specular X-ray diffraction and conversion electron Mößbauer spectroscopy. We show how models describing specular and diffuse X-ray diffraction can be applied to extract quantitative data. The robustness of such data can be further enhanced using anomalous scattering, leading to an enhanced material contrast for Fe/Cr. Similarity and complementarity of the X-ray diffraction results with the Mößbauer data are discussed. Copyright 1998 Academic Press

Key Words: multilayers, interface structure, X-ray diffraction, magnetism

Corresponding address: Dr Rainer Schad, Research Institute for Materials, Katholieke Universiteit Nijmegen, Toernooiveld 1, NL 6525 ED Nijmegen, The Netherlands.

Present address: Philips Optical Storage, Kempische Steenweg 293, 3500 Hasselt, Belgium.

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