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Effect of interface structure on magnetic and magnetoresistive properties of Fe/Cr multilayers

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DOI: 10.1016/S0304-8853(01)00892-7
PII: S0304-8853(01)00892-7
Copyright © 2001 Published by Elsevier Science B.V. All rights reserved.

V. V. Ustinov^,^*, L. N. Romashev, T. P. Krinitsina, E. A. Kravtsov, M. A. Milyaev, A. V. Semerikov, V. A. Tsurin and N. V. Kourtina

Ural Division of the Russian Academy of Sciences, Institute of Metal Physics, 18 Sofia Kovalevskaya St., 620219 Ekaterinburg, Russia

Available online 24 October 2001.

The influence of growth temperature on atomic and magnetic interface structure was traced in Fe/Cr multilayers grown with MBE at different substrate temperatures in the range 20_¯480°C. Proper growth was found to be possible only in a narrow temperature range about 140_¯180°C, deviations from optimal temperature causing drastic increase in interface roughness. Giant magnetoresistive effect was shown to be in close correlation with the interface structure.

Author Keywords: Multilayers, metallic; Interface structure; Magnetoresistance, giant; X-ray reflectivity

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Fig. 1. Experimental (points) and fitted (line) X-ray reflectivity spectra measured at Co K radiation from the Fe/Cr multilayer grown at substrate temperature T=240°C.

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Fig. 2. Substrate temperature T dependence of vertical rms roughness at Fe-on-Cr (squares) and Cr-on-Fe (circles) interfaces in Fe/Cr multilayers deduced from XR data.

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Fig. 3. Growth temperature dependence of relative area S_-Fe of

-Fe subspectrum in the resulting Mössbauer specrum. Insets: (a) typical multilayer Mössbauer spectrum; (b) reduced hyperfine-field B_hf distributions for multilayers grown at 20 and 180°C.

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Fig. 4. Magnetisation curves measured with a SQUID magnetometer for multilayers grown at 20, 180 and 280°C.

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Fig. 5. The value of the giant magnetoresistance effect as a function of growth temperature. The insets show magnetic field dependences of magnetoresistance in some multilayers grown at different temperatures. The sample grown at 480°C displays insignificant magnetoresistance effect due to complete degradation of the layer structure.

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5. B. Heinrich and J.F. Cochran Adv. Phys. 42 (1993), p. 523. Abstract-INSPEC | $Order Document

6. R. Schad, P. Belien, G. Verbanck, C.D. Potter, H. Fischer, S. Lefebvre, M. Bessiere, V.V. Moshchalkov and Y. Bruynseraede Phys. Rev. B 57 (1998), p. 13692. Abstract-INSPEC | $Order Document | Full-text via CrossRef | APS full text

^* Corresponding author. Tel.: +7-3432-444471; Fax: +7-3432-745244

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