DOI: 10.1016/S0304-8853(01)00911-8 PII: S0304-8853(01)00911-8 Copyright © 2001 Published by Elsevier Science B.V. All rights reserved.
Method of the reflections function in the X-ray reflectometry study of multilayers N. V. Kourtina, , E. A. Kravtsov and V. V. Ustinov Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, 18, S. Kovalevskaya St., GSP-170, Ekaterinburg, 620219, Russia Available online 24 October 2001.
N. V. Kourtina, , E. A. Kravtsov and V. V. Ustinov
A theory of specular X-ray reflectivity from a rough interface based on the reflection function method is proposed. By using the approximation of the abruptly changing potential, we represent a reflectivity in the form of a series. Its first term reproduces the Nevot¯Croce approximation and the second one gives the phase correction, which can be used to obtain the degree of interface asymmetry. The model X-ray reflectometry profiles for Fe/Cr superlattice are used to illustrate the method.
Author Keywords: Multilayers, metallic; Interface structure; X-ray reflectivity
1. V. Holy, U. Pietsch and T. Baumbach High-Resolution X-ray Scattering from Thin Films and Multilayers, Springer, Berlin, Heidelberg (1999).
2. X.-H. Zhou and S.-L. Chen Phys. Rep. 257 (1995), pp. 223¯348.
3. V.V. Babikov Phase Function Method in Quantum Mechanics, Moscow, Nauka (1976) (in Russian) .
4. J.M. Bai, E.E. Fullerton and P.A. Montano Phys. B 221 (1996), p. 411. Abstract | Journal Format-PDF (256 K)
5. L. Nevot and P. Croce Rev. Phys. Appl. 15 (1980), p. 761. Abstract-INSPEC | $Order Document
6. L.G. Parratt Phys. Rev. 45 (1954), p. 359.
Corresponding author. Fax: +7-343-92-327-37; email: hope@imp.uran.ru
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