Go to ScienceDirect Home Skip Main Navigation Links Register or Login: Password: Home Search Browse Journals Browse Abstract Databases Browse Reference Works My Alerts My Profile Help (Opens new window) Quick Search: within Quick Search searches abstracts, titles, and keywords. Click for more information. 149 of 183 Result List Previous Next Journal of Magnetism and Magnetic Materials Volume 240, Issues 1-3 , February 2002, Pages 494-496 This Document SummaryPlus Full Text + Links PDF (131 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert E-mail Article Export Citation DOI: 10.1016/S0304-8853(01)00911-8 PII: S0304-8853(01)00911-8 Copyright © 2002 Elsevier Science B.V. All rights reserved. Method of the reflections function in the X-ray reflectometry study of multilayers N. V. KourtinaCorresponding Author Contact Information <#m4.cor*>, E-mail The Corresponding Author , E. A. Kravtsov and V. V. Ustinov Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, 18, S. Kovalevskaya St., GSP-170, Ekaterinburg, 620219, Russia Available online 24 October 2001. Abstract A theory of specular X-ray reflectivity from a rough interface based on the reflection function method is proposed. By using the approximation of the abruptly changing potential, we represent a reflectivity in the form of a series. Its first term reproduces the Nevot?Croce approximation and the second one gives the phase correction, which can be used to obtain the degree of interface asymmetry. The model X-ray reflectometry profiles for Fe/Cr superlattice are used to illustrate the method. Author Keywords: Multilayers, metallic; Interface structure; X-ray reflectivity Article Outline round bullet, filled References Enlarge Image (3K) Fig. 1. The linear segment form of the profile g_(z), corresponding to the interface of a width 2a. The "symmetric" case is shown by the dashed line, and the "asymmetric" one is depicted by the shaded region. Enlarge Image (6K) Fig. 2. Model X-ray reflectivity profiles for multilayer structure Al2O3/Cr(70 Å)/[Fe(20 Å)/Cr(9 Å)]8 calculated without asymmetric phase corrections (points), and with asymmetric phase correction (small mu, Greek1=0.2, solid line). Wave length small lambda, Greek=1.789Å. References 1. V. Holy, U. Pietsch and T. Baumbach High-Resolution X-ray Scattering from Thin Films and Multilayers, Springer, Berlin, Heidelberg (1999). 2. X.-H. Zhou and S.-L. Chen Phys. Rep. 257 (1995), pp. 223?348. 3. V.V. Babikov Phase Function Method in Quantum Mechanics, Moscow, Nauka (1976) (in Russian) . 4. J.M. Bai, E.E. Fullerton and P.A. Montano Phys. B 221 (1996), p. 411. Abstract | PDF (256 K) 5. L. Nevot and P. Croce Rev. Phys. Appl. 15 (1980), p. 761. Abstract-INSPEC | $Order Document 6. L.G. Parratt Phys. Rev. 45 (1954), p. 359. Full Text via CrossRef Corresponding Author Contact Information <#m4.bcor*> Corresponding author. Fax: +7-343-92-327-37; email: hope@imp.uran.ru This Document SummaryPlus Full Text + Links PDF (131 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert E-mail Article Export Citation Journal of Magnetism and Magnetic Materials Volume 240, Issues 1-3 , February 2002, Pages 494-496 149 of 183 Result List Previous Next Home Search Forms Browse Journals Browse Abstract Databases Browse Reference Works My Alerts My Profile Help (Opens new window) Send feedback to ScienceDirect Software and compilation © 2002 ScienceDirect. All rights reserved. ScienceDirect® is an Elsevier Science B.V. registered trademark. Your use of this service is governed by Terms and Conditions . Please review our Privacy Policy for details on how we protect information that you supply.