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PII: S0304-8853(96)00063-7

Interface roughness in Fe(100)/Cr film structures studied by CEMS

Ch. Sauer^{a, *}, F. Klinkhammer^a, E. Yu. Tsymbal^a, S. Handschuh^a, Q. Leng^a and W. Zinn<sup>a

a</sup> Institut für Festkörperforschung, Forschungszentrum Jülich GmbH D-52425 Jülich Germany

Received 3 October 1995; revised 28 November 1995. Available online 8 December 1999.

Abstract

Various epitaxial Fe(100)/Cr film structures were MBE-grown on MgO(100) and GaAs(100) substrates with the aim to modify the roughness of the Fe/Cr interfaces. By introducing a 2 monolayer thick e⁵⁷Fe probe layer at the interface the distribution of the magnetic hyperfine (hf) fields could be measured locally by means of e⁵⁷Fe conversion electron Mössbauer spectroscopy (CEMS). A simple model is applied which allows the determination of a pattern of the average interface roughness from this hf field distribution. It was observed that even samples of high epitaxial quality according to LEED and RHEED reveal a micro-roughness on a lateral scale of 1-2 nm due to intermixing of Fe and Cr within 1-2 monolayers.

Author Keywords: Mössbauer effect; CEMS; Interface roughness; Fe(100)/Cr; Layered structures

^*Corresponding author.

	This document Abstract Journal Format-PDF (680 K) Actions Cited By Save as Citation Alert Export Citation Journal of Magnetism and Magnetic Materials Volume 161 August 1996 Pages 49-56

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