Skip Main Navigation Links
ScienceDirect Logo Skip Main Navigation Links
 Register or Login:   Password:      
HomeBrowseSearch FormsMy AlertsMy ProfileHelp (Opens new window)
 Quick Search:  within Quick Search searches abstracts, titles, and keywords. Click for more information.
147 of 238 Result ListPreviousNext
Journal of Magnetism and Magnetic Materials
Volumes 198-199, 1 June 1999, Pages 468-470
This Document
SummaryPlus
Full Text + Links
PDF (87 K)

Actions
Cited By
Save as Citation Alert
Export Citation

PII: S0304-8853(98)01155-X
Copyright © 1999 Elsevier Science B.V. All rights reserved.

Coercivity induced by random field at ferromagnetic and antiferromagnetic interfaces

S. ZhangCorresponding Author Contact Information, E-mail The Corresponding Author, a, D. V. Dimitrovb, G. C. Hadjipanayisb, J. W. Caic and C. L. Chienc

a Physics Department, New York University, 4 Washington Place, New York, NY 10003, USA
b Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA
c Department of Physics, Johns Hopkins University, Baltimore, MD 21218, USA

Available online 7 January 2000.

Abstract

In the presence of random fields at an interface between a ferromagnetic and an antiferromagnetic layer, the domain walls in the ferromagnetic layer are pinned by local minimum energy. To move the domain walls, an applied magnetic field must be large enough to overcome statistically fluctuating energy. We have calculated this energy and found that the coercivity can be as large as a few kOe for a thin ferromagnetic layer. It is also found that the coercive field at low temperature scales as 1/t3/2 where t is the F layer thickness, and the coercive field decreases strongly with temperature.

Author Keywords: Coercivity; Exchange bias

Article Outline

round bullet, filled References


Enlarge Image
(4K)
Fig. 1. The values of coercivity as function of NiFe thickness t of exchange-coupled NiFe(t)/CoO at 80 K and Ni0.5Co0.5O/NiFe(t) at 10 K showing the Hc=A/tn dependence with n=1.51±0.05 and 1.427±0.05, respectively.

References

1. W.P. Meiklejohn and C.P. Bean. Phys. Rev. 102 (1956), p. 1413. Full-text via CrossRef

2. C. Mauri, H.C. Siegmann, P.S. Bagus and E. Kay. J. Appl. Phys. 62 (1987), p. 3034.

3. N.C. Koon. Phys. Rev. Lett. 78 (1997), p. 4865. Abstract-INSPEC   | $Order Document | APS full text | Full-text via CrossRef

4. A.P. Malozemoff. Phys. Rev. B. 35 (1987), p. 3679. Abstract-INSPEC   | $Order Document | Full-text via CrossRef

5. A.P. Malozemoff. J. Appl. Phys. 63 (1988), p. 3876.

6. H. Hoffmann and Toshitaka. J. Magn. Magn. Mater. 128 (1993), p. 395. Abstract-Compendex | Abstract-INSPEC   | $Order Document

7. H. Hoffmann. IEEE Trans. Magn. 9 (1973), p. 17. Abstract-INSPEC | Abstract-Compendex   | $Order Document

Corresponding Author Contact Information Corresponding author. Tel.: +1-212-9987724; fax: +1-212-9954016; email: shufeng.zhng@nyu.edu
This Document
SummaryPlus
Full Text + Links
PDF (87 K)

Actions
Cited By
Save as Citation Alert
Export Citation
Journal of Magnetism and Magnetic Materials
Volumes 198-199, 1 June 1999, Pages 468-470


147 of 238 Result ListPreviousNext
HomeBrowseSearch FormsMy AlertsMy ProfileHelp (Opens new window) ScienceDirect Logo

Send feedback to ScienceDirect
Software and compilation © 2002 ScienceDirect. All rights reserved.
ScienceDirect® is an Elsevier Science B.V. registered trademark.


Your use of this service is governed by Terms and Conditions. Please review our Privacy Policy for details on how we protect information that you supply.