Abstract

We present expressions for the resonant magnetic X-ray scattering (XRMS) by surfaces possessing roughness and analyze both the structural and magnetic roughness of a surface, as well as their correlation. We demonstrate that the leading contribution to the difference (ΔI) in the diffuse scattering between left- and right-circularly polarized light for a rough surface vanishes unless the structural and magnetic roughnesses are correlated, to leading order in the magnetization. The effects of magnetic domain structure and magnetic dead layers on the surface scattering are also discussed.

Author Keywords: X-ray resonant magnetic scattering; Surface roughness

Article Outline

• References

(4K)
Fig. 1. Reference frame and sketch of the structural (charge) and magnetic interfaces, which in general can be separated from one another by an average amount Δ. Grazing angles of incidence () and scattering () are illustrated. Dotted lines indicate the locations of the average magnetic and structural surfaces.

(3K)
Fig. 2. Longitudinal diffuse scan (|ΔI| as a function of q_z with q_x=0.004 Å⁻¹), with =1.57 Å(7.88 keV), with (filled symbols) and with out (unfilled symbols) the presence of a 10 Å dead layer at the surface. Simulation parameters are referred to in the text.

(5K)
Fig. 3. experimentally measured values of ΔI (filled dots) and I₊+I₋)/2 (filled squares) for a Si/Cu/(400 AA)/Co_0.95 Fe_0.05(50 Å)/Cu(30 Å) sample, plotted as a function of q_x, the transverse momentum transfer, at q_z=0.0685 Å⁻¹. The specular peak is located at q_x=0 and was not fitted. A simulation of ΔI is denoted by unmarked squares; a simulation of I_ave is denoted by unfilled circles. Triangles denote a simulation of . Simulation parameters are referred to in the text.

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Corresponding author; email: sksinha@aps.anl.gov