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Physica B: Condensed Matter
Volumes 267-268, June 1999, Pages 162-167

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PII: S0921-4526(99)00014-9
Copyright © 1999 Published by Elsevier Science B.V. All rights reserved.

Towards a 3D magnetometry by neutron reflectometry

C. Fermon ^,^,^a, F. Ott^b, B. Gilles^c, A. Marty^d, A. Menelle^b, Y. Samson^d, G. Legoff^a and G. Francinet^a

^a DRECAM/SPEC CEA Saclay, 91191 Gif sur Yvette cedex, France
^b Laboratoire Léon Brillouin, CEA-CNRS 91191 Gif sur Yvette Cedex, France
^c LTPCM, ENSEEG, B.P. 75, 38 042 Grenoble, France
^d CEA-Grenoble, Département de Recherche Fondamentale sur la Matière Condensée/SP2M, 17 rue des Martyrs, 38 054 Grenoble Cedex 9, France

Available online 10 January 2000.

Abstract

Specular polarised neutron reflectometry with polarisation analysis allows one to probe in-depth magnetic profiles of thin films (along the normal to the film). Off-specular reflectometry gives information about lateral structures (in the plane of the film) with typical lengthscales ranging from 5 to 100 small mu, Greek m. Furthermore, surface diffraction at grazing angle gives access to transverse dimensions between 10 nm and 300 nm with a resolution in that direction of a few nanometers. The combination of these three techniques applied to magnetic systems can lead to a 3D magnetic structure measurement. Such a technique is however not applicable to the study of a single magnetic dot, but it can generate unique results in several cases including patterns of domain walls in thin films with perpendicular anisotropy, arrays of magnetic dots, and patterned lines in magnetic thin films.

Author Keywords: Magnetometry; Neutron reflectometry; Polarisation analysis

PACS classification codes: 61.12 Ha; 75.70 Kw; 75.70.-i

Article Outline

1. Introduction
2. General ideas
3. Non-specular neutron diffraction on periodic gratings
4. Diffraction on periodic magnetic stripe domains
5. Conclusion
References

(7K)
Fig. 1. Setup of the experiment. It is possible to study off-specular diffusion in the plane of incidence (along the "off-specular" line) and in the plane perpendicular to the plane of incidence (along the "surface diffraction" line).

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Fig. 2. Diffraction map in the (q_x, q_z) plane on a grating of nickel lines (width 5 small mu, Greek

m, periodicity 10 small mu, Greek

m, thickness 90 nm) deposited on a glass substrate. The line q_x=0 corresponds to the specular reflection, the other lines correspond to diffraction modes.

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Fig. 3. Intensity of the diffracted modes +1 and -1 (triangles and squares) versus q_z. Numerical fits are plotted in black lines. For clarity, the intensities of the mode -1 (resp. +1) have been divided by a factor of 100 (resp. 10 000).

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Fig. 4. Diffraction geometry and off-specular diffusion signal measured on a network of magnetic domains using a multidetector (top pciture). The top peaks are the specular and off-specular peaks. The bottom signal is due to the refracted wave. The bottom picture is a MFM image of magnetic domains observed in the Fe_0.5Pd_0.5 thin films.

(8K)
Fig. 5. Calculated off-specular signal as measured on a multidetector for two different incidence angles (a) straight theta, small theta, Greek

_inc=

_c=0.5° and (b) straight theta, small theta, Greek

_inc=0.7°. The peaks maximum does not move but the intensity decreases as soon as the incidence angle is moved away from the critical angle straight theta, small theta, Greek

_c.

References

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Corresponding author. Fax: 33-1-69-08-87-86; email: cfermon@cea.fr

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Physica B: Condensed Matter
Volumes 267-268, June 1999, Pages 162-167

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