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In-situ investigation of Fe ultrathin film growth by infrared transmission spectroscopy

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Surface Science

Volumes 433-435
2 August 1999
Pages 162-166

PII: S0039-6028(99)00168-5
Copyright © 1999 Elsevier Science B.V. All rights reserved.

G. Fahsold ^,, A. Bartel, O. Krauth and A. Lehmann ¹

Institut für Angewandte Physik, Ruprecht-Karls-Universität Heidelberg, Albert-Ueberle-Str. 3_¯5, D-69120 Heidelberg, Germany

Available online 21 August 2000.

IR-transmission spectroscopy is sensitive to charge transport and charge localization. Applied to low-dimensional metallic systems, this offers the possibility to investigate morphology on a nanometer scale during thin film growth by IR-optical methods. We performed in-situ IR-transmission spectroscopy during deposition of Fe on UHV-cleaved MgO(001) at 313 K and at 121 K. At thicknesses corresponding to a few monolayers of Fe, we find extremely weak IR-absorption that is due to island morphology as known from our previous helium-atom-scattering results for the same system. For complete substrate coverages, the comparison of IR-transmittance with calculations for homogeneous films indicates significant attenuation of IR-absorption due to additional scattering of charge carriers at the irregular surface as a result of preceding island growth.

Author Keywords: Infrared spectroscopy; Iron; Thin films

1. Introduction
2. Experiment and results
3. Discussion
4. Summary
Acknowledgements
References

(9K)
Fig. 1. Transmittance spectra (normal incidence) of Fe growing on MgO(001) at various temperatures (313 and 121 K). Unity means the same transmittance as the substrate. The labels indicate the film thickness (see text).

(9K)
Fig. 2. As Fig. 1, but for very low thicknesses at 121 K. From spectrum to spectrum, the thickness increases by ~0.4 Å. Bold lines indicate approximately complete Fe monolayers (ML).

(8K)
Fig. 3. Change in Fe thin film transmittance (at 2000 cm^-1) with increasing film thickness. The substrate temperature is 121 K (open circles) and 313 K (solid circles). The lines in the lower part of the figure show the HAS reflectivity for the growth of the same system at similar temperatures, i.e. at 140 K (dashed line) and at 300 K (full line). The minimum of HAS reflectivity (dotted arrows) and the optical cross-over (full arrows) are indicated.

(8K)
Fig. 4. Transmittance spectra (as in Fig. 1) for Fe thin films of 15 and 25 Å thickness, respectively, on MgO(001). Full line: experimental result for growth at 313 K. Dotted line: best fit result assuming real bulk dielectric properties and additional electron-surface scattering (see text). Dashed line: calculation result assuming real bulk dielectric properties but no size effects. Obviously, calculations omitting size effects fail in describing the experimental curves.

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¹ New surname: Pucci.

Corresponding author. Fax: +49-6221-549262; email: fahsold@urz.uni-heidelberg.de

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Surface Science
Volumes 433-435
2 August 1999
Pages 162-166

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