Proceedings of XXXIV Zakopane School of Physics

Zakopane, Poland, 9-15 May, 1999

Edited by Edward A. Gorlich and Antoni T. Pedziwiatr

Wydawnictwo Universytetu Jagiellonskiego
Krakow 1999

p151-161

Some basic aspects of synchrotron Mössbauer reflectometrz
L. Deak, L. Bottyan, M. Major, D. L. Nagy, H. Spiering and E. Szilagyi

KFKI Research Institute for Particle and Nuclear Physics, H-1525
Budapest POB 49, Hungary
Institut fur Anorgaische Chemie und Analytische Chemie, 
Johannes Gutenberg Universitat, Staudiner Weg 9, 
D-55099 Mainz, Germany

Synchrotron Mossbauer Reflectometry (grazing incidence nuclear resonant 
scattering of synchrotron radiation, SMR) is a novel technique capable of 
depth profiling the hyperfine interactions close to the surface of thin 
films and multilayers on a nm scale. The principles of SMR are briefly 
summarised. A picturesque explanation of the appearance of the "total 
reflection peak" in the time integral delayed photon intensity is 
presented. It is shown that a fast algorithm for calculating SMR data 
exists that can be easily deduced both from anisotropic optical model and 
from dynamic theory of nuclear resonant x-ray scattering.