Abstract

The new reflectometer ADAM at the ILL is described and some of the results obtained in the first year of operation are presented. These include a reflectivity of a Si wafer over eight orders of magnitude, a measurement of a thick [⁵⁶Fe/⁵⁷Fe] isotope superlattice, and a polarised reflectivity of a Co/Cu multilayer. The instrument is now available to outside users.

Author Keywords: Neutron reflectometry; Polarisation analysis; Instrumentation

Article Outline

Acknowledgements

References

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Fig. 1. Schematic side view of the ADAM reflectometer at the ILL in Grenoble/France.

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Fig. 2. Reflectivity of a Si wafer measured over eight nearly orders of magnitude with ADAM. For details see text.

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Fig. 3. Reflectivity of an epitaxially sputtered superlattice of nominal composition Pd 50 Å/⁵⁶Fe 90 Å[⁵⁷Fe 10 Å/⁵⁶Fe 90 Å]₁₅/MgO (substrate size 4 cm²). In the insets blowups of the measured reflectivity are shown making the very short period Kiessig fringes visible. The line is a guide to the eye.

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Fig. 4. Reflectivity of a [Cu 15 Å/Co 34 Å]₇/Al₂O₃ multilayer measured on ADAM using the polarisation analysis option. On the right-hand side the scattering geometry is depicted with the scattering vector Q perpendicular to the film plane and the NSF (non-spin flip) and SF (spin flip) axes, as described in the text. (a) and (b) show the measured reflectivities for the two sample orientations shown on the right.

References

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2. Wavelengths corresponding to harmonics higher than n=2 are not transmitted to the monochromator by the guide.

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^*Corresponding author. Tel.: +49 234 7003 625; fax: +49 234 7094 173; e-mail: andreas.schreyer@ruhr-uni-bochum.de.