APS Journals Homepage Physical Review Online Archive Homepage Contact Information Online Journal Help Physical Review Online Archive Homepage Browse Available Volumes Search Members Subscription Information What's New in PROLA?
Volume: Page/Article:

Article Collection: View Collection  Help (Click on the Check Box to add an article.)

Phys. Rev. B 57, 13692–13697 (1998)

[Issue 21 – 1 June 1998 ]

Previous article | Next article | Issue 21 contents ]

Add to article collection View PDF (94 kB)


Quantitative study of the interdependence OF interface structure and giant magnetoresistance in polycrystalline Fe/Cr superlattices

R. Schad*
Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Research Institute for Materials, KU Nijmegen, NL-6525 ED Nijmegen, The Netherlands
P. Beliën§, G. Verbanck, and C. D. Potter
Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
H. Fischer
Institute Laue Langevin, 38042 Grenoble Cedex 9, France
S. Lefebvre and M. Bessiere
LURE, Université de Paris-Sud, 91405 Orsay Cedex, France
V. V. Moshchalkov and Y. Bruynseraede
Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Received 15 September 1997

We present a quantitative characterization of the interface roughness of Fe/Cr superlattices based on specular and off-specular x-ray diffraction using anomalous scattering. We discuss the dependence of the amplitude of the giant magnetoresistance (GMR) effect, including changes in the interlayer magnetic coupling, on the interface structure. We observe a reduction of the GMR effect with increasing amplitude of the interface roughness having constant lateral correlation length. However, the physical interpretation of this clear result in terms of spin-dependent interface scattering remains unclear because of the unknown bulk contribution.

©1998 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v57/p13692
DOI: 10.1103/PhysRevB.57.13692
PACS: 75.70.Pa, 68.35.Ct, 61.10.-i


* Author to whom correspondence should be addressed: Research Institute for Materials, Katholieke Universiteit Nijmegen, Toernooiveld 1, NL 6525 ED Nijmegen, The Netherlands, Fax +31 (0)24 3652190. Electronic mail: schad@sci.kun.nl
§ Present address: Philips Optical Storage, Kempische Steenweg 293, 3500 Hasselt, Belgium.

Add to article collection View PDF (94 kB)

Previous article | Next article | Issue 21 contents ]


References

(Reference links marked with dot may require a separate subscription.)
  1. M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen Van Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, and J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988).
  2. R. Q. Hood, L. M. Falicov, and D. R. Penn, Phys. Rev. B 49, 368 (1994).
  3. Y. Asano, A. Oguria, and S. Maekawa, Phys. Rev. B 48, 6192 (1993).
  4. J. Barnas and Y. Bruynseraede, Phys. Rev. B 53, 5449 (1996).
  5. I. A. Campbell and A. Fert, in Ferromagnetic Materials, edited by E. P. Wohlfarth (North-Holland, Amsterdam, 1982).
  6. J. Barnas, A. Fuss, R. E. Camley, P. Grünberg, and W. Zinn, Phys. Rev. B 42, 8110 (1990).
  7. J. Barnas, A. Fuss, R. E. Camley, U. Walz, P. Grünberg, and W. Zinn, Vacuum 41, 1241 (1990) [dot INSPEC].
  8. M. Rührig, R. Schäfer, A. Huber, R. Mosler, J. A. Wolf, S. Demokritov, and P. Grünberg, Phys. Status Solidi A 125, 635 (1991) [dot INSPEC].
  9. C. D. Potter, R. Schad, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, M. Schäfer, R. Schäfer, and P. Grünberg, Phys. Rev. B 49, 16 055 (1994); ; R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, M. Schäfer, R. Schäfer, and P. Grünberg, J. Appl. Phys. 76, 6604 (1994) [dot INSPEC].
  10. J. C. Slonszewski, Phys. Rev. Lett. 67, 3172 (1991).
  11. J. C. Slonszewski, J. Appl. Phys. 73, 5975 (1993) [dot INSPEC].
  12. Kees M. Schep, Paul J. Kelly, and Gerrit E. W. Bauer, Phys. Rev. Lett. 74, 586 (1995).
  13. P. Zahn, I. Mertig, M. Richter, and H. Eschrig, Phys. Rev. Lett. 75, 2996 (1995).
  14. I. Mertig, P. Zahn, M. Richter, H. Eschrig, R. Zeller, and P. H. Dederichs, J. Magn. Magn. Mater. 151, 363 (1996) [dot INSPEC].
  15. C. T. Yu, K. Westerholt, K. Theis-Bröhl, and H. Zabel J. Appl. Phys. 82, 5560 (1997) [dot INSPEC].
  16. E. E. Fullerton, D. M. Kelly, J. Guimpel, I. K. Schuller, and Y. Bruynseraede, Phys. Rev. Lett. 68, 859 (1992).
  17. N. M. Rensing, A. P. Payne, and B. M. Clemens, J. Magn. Magn. Mater. 121, 436 (1993) [dot INSPEC].
  18. N. M. Rensing, B. M. Clemens, and D. L. Williamson, J. Appl. Phys. 79, 7757 (1996) [dot INSPEC].
  19. S. Joo, Y. Obi, K. Takanashi, and H. Fujimori, J. Magn. Magn. Mater. 104, 1753 (1992) [dot INSPEC].
  20. P. Beliën, R. Schad, C. D. Potter, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. B 50, 9957 (1994).
  21. J. M. Colino, I. K. Schuller, R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. B 53, 766 (1996).
  22. J. M. Colino, I. K. Schuller, V. Korenivski, and K. V. Rao, Phys. Rev. B 54, 13 030 (1996).
  23. H. J. M. Swagten, G. J. Strijkers, G. L. J. Verschueren, M. M. H. Willekens, and W. J. M. de Jonge, J. Magn. Magn. Mater. 176, 169 (1997) [dot INSPEC].
  24. E. E. Fullerton, I. K. Schuller, H. Vanderstraeten, and Y. Bruynseraede, Phys. Rev. B 45, 9292 (1992).
  25. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
  26. V. Holý J. Kubeña, I. Ohídal, K. Lischka, and W. Poltz, Phys. Rev. B 47, 15 896 (1993).
  27. V. Holý and T. Baumbach, Phys. Rev. B 49, 10 668 (1994).
  28. J.-P. Schlomka, M. Tolan, L. Schwalowsky, O. H. Seeck, J. Stettner, and W. Press, Phys. Rev. B 51, 2311 (1995).
  29. H. E. Fischer, H. Fischer, O. Durand, O. Pellegrino, S. Andrieu, M. Picuch, S. Lefebvre, and M. Bessiere, Nucl. Instrum. Methods Phys. Res. B 97, 402 (1995).
  30. H. E. Fischer, H. M. Fischer, and M. Picuch (unpublished).
  31. Henry E. Fischer, memoire DHDR (Diplome d'Habilitation a Diriger les Recherches), Universite Joseph Fourier, Grenoble, France.
  32. W. Sevenhans, J.-P. Locquet, and Y. Bruynseraede, Rev. Sci. Instrum. 57, 937 (1986) [dot SPIN][dot INSPEC].
  33. E. E. Fullerton, M. J. Conover, J. E. Mattson, C. H. Sowers, and S. D. Bader, Appl. Phys. Lett. 63, 1699 (1993) [dot INSPEC].
  34. R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Appl. Phys. Lett. 64, 3500 (1994) [dot INSPEC].
  35. R. Schad, J. Barnas, P. Beliën, G. Verbanck, C. D. Potter, H. Fischer, S. Lefebvre, M. Bessiere, V. V. Moshchalkov, and Y. Bruynseraede, J. Magn. Magn. Mater. 156, 339 (1996) [dot INSPEC].
  36. The properties of the top oxide layer (typical thickness, roughness, composition, and optical parameters) were characterized in independent experiments [R. Schad, D. Bahr, J. Falta, G. Materlik, P. Beliën, G. Verbanck, K. Temst, and Y. Bruynseraede, J. Phys. Condens. Matter 10, 61 (1998) [dot INSPEC].
  37. S. Brennan and P. L. Cowan, Rev. Sci. Instrum. 63, 850 (1992) [dot INSPEC].
  38. K. Temst, M. J. Van Bael, B. Wuyts, C. van Haesendonck, Y. Bruynseraede, D. G. de Groot, N. Koeman, and R. Griessen, Appl. Phys. Lett. 67, 3429 (1995) [dot INSPEC].
  39. A. Kaserer and E. Gerlach, Z. Phys. B 97, 139 (1995).


Add to article collection View PDF (94 kB)

[Show Articles Citing This One] Requires Subscription

Previous article | Next article | Issue 21 contents ]








[ APS   |   APS Journals   |   PROLA Homepage   |   Browse   |   Search ]
E-mail: prola@aps.org