Article Collection: View Collection Help (Click on the to add an article.)
Phys. Rev. B 57, 1369213697 (1998)
[Issue 21 1 June 1998 ]
[ Previous article | Next article | Issue 21 contents ]
View PDF (94 kB)
Quantitative study of the interdependence OF interface structure and giant magnetoresistance in polycrystalline Fe/Cr superlattices
- R. Schad*
- Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
- Research Institute for Materials, KU Nijmegen, NL-6525 ED Nijmegen, The Netherlands
- P. Beliën§, G. Verbanck, and C. D. Potter
- Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
- H. Fischer
- Institute Laue Langevin, 38042 Grenoble Cedex 9, France
- S. Lefebvre and M. Bessiere
- LURE, Université de Paris-Sud, 91405 Orsay Cedex, France
- V. V. Moshchalkov and Y. Bruynseraede
- Laboratorium voor Vast-Stoffysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Received 15 September 1997We present a quantitative characterization of the interface roughness of Fe/Cr superlattices based on specular and off-specular x-ray diffraction using anomalous scattering. We discuss the dependence of the amplitude of the giant magnetoresistance (GMR) effect, including changes in the interlayer magnetic coupling, on the interface structure. We observe a reduction of the GMR effect with increasing amplitude of the interface roughness having constant lateral correlation length. However, the physical interpretation of this clear result in terms of spin-dependent interface scattering remains unclear because of the unknown bulk contribution.
©1998 The American Physical Society
URL: http://link.aps.org/abstract/PRB/v57/p13692
DOI: 10.1103/PhysRevB.57.13692
PACS: 75.70.Pa, 68.35.Ct, 61.10.-i
* Author to whom correspondence should be addressed: Research Institute for Materials, Katholieke Universiteit Nijmegen, Toernooiveld 1, NL 6525 ED Nijmegen, The Netherlands, Fax +31 (0)24 3652190. Electronic mail: schad@sci.kun.nl
§ Present address: Philips Optical Storage, Kempische Steenweg 293, 3500 Hasselt, Belgium.
View PDF (94 kB)[ Previous article | Next article | Issue 21 contents ]
References
(Reference links marked with may require a separate subscription.)
- M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen Van Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, and J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988).
- R. Q. Hood, L. M. Falicov, and D. R. Penn, Phys. Rev. B 49, 368 (1994).
- Y. Asano, A. Oguria, and S. Maekawa, Phys. Rev. B 48, 6192 (1993).
- J. Barnas and Y. Bruynseraede, Phys. Rev. B 53, 5449 (1996).
- I. A. Campbell and A. Fert, in Ferromagnetic Materials, edited by E. P. Wohlfarth (North-Holland, Amsterdam, 1982).
- J. Barnas, A. Fuss, R. E. Camley, P. Grünberg, and W. Zinn, Phys. Rev. B 42, 8110 (1990).
- J. Barnas, A. Fuss, R. E. Camley, U. Walz, P. Grünberg, and W. Zinn, Vacuum 41, 1241 (1990) [ INSPEC].
- M. Rührig, R. Schäfer, A. Huber, R. Mosler, J. A. Wolf, S. Demokritov, and P. Grünberg, Phys. Status Solidi A 125, 635 (1991) [ INSPEC].
- C. D. Potter, R. Schad, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, M. Schäfer, R. Schäfer, and P. Grünberg, Phys. Rev. B 49, 16 055 (1994); ; R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, M. Schäfer, R. Schäfer, and P. Grünberg, J. Appl. Phys. 76, 6604 (1994) [ INSPEC].
- J. C. Slonszewski, Phys. Rev. Lett. 67, 3172 (1991).
- J. C. Slonszewski, J. Appl. Phys. 73, 5975 (1993) [ INSPEC].
- Kees M. Schep, Paul J. Kelly, and Gerrit E. W. Bauer, Phys. Rev. Lett. 74, 586 (1995).
- P. Zahn, I. Mertig, M. Richter, and H. Eschrig, Phys. Rev. Lett. 75, 2996 (1995).
- I. Mertig, P. Zahn, M. Richter, H. Eschrig, R. Zeller, and P. H. Dederichs, J. Magn. Magn. Mater. 151, 363 (1996) [ INSPEC].
- C. T. Yu, K. Westerholt, K. Theis-Bröhl, and H. Zabel J. Appl. Phys. 82, 5560 (1997) [ INSPEC].
- E. E. Fullerton, D. M. Kelly, J. Guimpel, I. K. Schuller, and Y. Bruynseraede, Phys. Rev. Lett. 68, 859 (1992).
- N. M. Rensing, A. P. Payne, and B. M. Clemens, J. Magn. Magn. Mater. 121, 436 (1993) [ INSPEC].
- N. M. Rensing, B. M. Clemens, and D. L. Williamson, J. Appl. Phys. 79, 7757 (1996) [ INSPEC].
- S. Joo, Y. Obi, K. Takanashi, and H. Fujimori, J. Magn. Magn. Mater. 104, 1753 (1992) [ INSPEC].
- P. Beliën, R. Schad, C. D. Potter, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. B 50, 9957 (1994).
- J. M. Colino, I. K. Schuller, R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. B 53, 766 (1996).
- J. M. Colino, I. K. Schuller, V. Korenivski, and K. V. Rao, Phys. Rev. B 54, 13 030 (1996).
- H. J. M. Swagten, G. J. Strijkers, G. L. J. Verschueren, M. M. H. Willekens, and W. J. M. de Jonge, J. Magn. Magn. Mater. 176, 169 (1997) [ INSPEC].
- E. E. Fullerton, I. K. Schuller, H. Vanderstraeten, and Y. Bruynseraede, Phys. Rev. B 45, 9292 (1992).
- S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
- V. Holý J. Kubeña, I. Ohídal, K. Lischka, and W. Poltz, Phys. Rev. B 47, 15 896 (1993).
- V. Holý and T. Baumbach, Phys. Rev. B 49, 10 668 (1994).
- J.-P. Schlomka, M. Tolan, L. Schwalowsky, O. H. Seeck, J. Stettner, and W. Press, Phys. Rev. B 51, 2311 (1995).
- H. E. Fischer, H. Fischer, O. Durand, O. Pellegrino, S. Andrieu, M. Picuch, S. Lefebvre, and M. Bessiere, Nucl. Instrum. Methods Phys. Res. B 97, 402 (1995).
- H. E. Fischer, H. M. Fischer, and M. Picuch (unpublished).
- Henry E. Fischer, memoire DHDR (Diplome d'Habilitation a Diriger les Recherches), Universite Joseph Fourier, Grenoble, France.
- W. Sevenhans, J.-P. Locquet, and Y. Bruynseraede, Rev. Sci. Instrum. 57, 937 (1986) [ SPIN][ INSPEC].
- E. E. Fullerton, M. J. Conover, J. E. Mattson, C. H. Sowers, and S. D. Bader, Appl. Phys. Lett. 63, 1699 (1993) [ INSPEC].
- R. Schad, C. D. Potter, P. Beliën, G. Verbanck, V. V. Moshchalkov, and Y. Bruynseraede, Appl. Phys. Lett. 64, 3500 (1994) [ INSPEC].
- R. Schad, J. Barnas, P. Beliën, G. Verbanck, C. D. Potter, H. Fischer, S. Lefebvre, M. Bessiere, V. V. Moshchalkov, and Y. Bruynseraede, J. Magn. Magn. Mater. 156, 339 (1996) [ INSPEC].
- The properties of the top oxide layer (typical thickness, roughness, composition, and optical parameters) were characterized in independent experiments [R. Schad, D. Bahr, J. Falta, G. Materlik, P. Beliën, G. Verbanck, K. Temst, and Y. Bruynseraede, J. Phys. Condens. Matter 10, 61 (1998) [ INSPEC].
- S. Brennan and P. L. Cowan, Rev. Sci. Instrum. 63, 850 (1992) [ INSPEC].
- K. Temst, M. J. Van Bael, B. Wuyts, C. van Haesendonck, Y. Bruynseraede, D. G. de Groot, N. Koeman, and R. Griessen, Appl. Phys. Lett. 67, 3429 (1995) [ INSPEC].
- A. Kaserer and E. Gerlach, Z. Phys. B 97, 139 (1995).
View PDF (94 kB)
[Show Articles Citing This One] Requires Subscription[ Previous article | Next article | Issue 21 contents ]
E-mail: prola@aps.org