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PII: S0304-8853(97)01007-X

Electric transport properties of epitaxial Fe and Cr films with very low intralayer scattering

C. D. Potter^{d, b}, P. Beliën^{c, b}, R. Schad^{b, a, *}, G. Verbanck^b, K. Temst^b, V. V. Moshchalkov^b and Y. Bruynseraede<sup>b

a</sup> Research Institute for Materials, Katholieke Universiteit Nijmegen, Toernooiveld 1 NL 6525 ED Nijmegen Netherlands
^b Laboratorium voor Vaste-Stoffysika en Magnetisme, K.U. Leuven, Celestijnenlaan 200 D B-3001 Leuven Belgium
^c Philips Research Labs, Prof. Holstlaan 4 NL 5656 AA Eindhoven Netherlands
^d Argonne National Lab, 9700 S. Cass Ave Argonne, IL 60439 United States

Received 14 July 1997. Available online 18 June 1998.

Abstract

The low-temperature transport properties of epitaxial Fe and Cr films grown on MgO(1 0 0) substrates by molecular beam epitaxy are characterised by extremely low intralayer resistivities, indicating a very small concentration of defects. This makes such films particularly suitable for studies of the influence of the interface scattering on the transport properties of Fe/Cr superlattices.

Author Keywords: Electron transport; Thin films; Thickness dependence; Electron scattering; Giant magnetoresistance

^*Corresponding author.

	This document Abstract Journal Format-PDF (369 K) Actions Cited By Save as Citation Alert Export Citation Journal of Magnetism and Magnetic Materials Volume 182, Issues 1-2 February 1998 Pages 65-70

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