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Phys. Rev. B 57, R8111–R8114 (1998)

[Issue 14 – 1 April 1998 ]

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Asymmetry of domain nucleation and enhanced coercivity in exchange-biased epitaxial NiO/NiFe bilayers

V. I. Nikitenko, V. S. Gornakov, L. M. Dedukh, Yu. P. Kabanov, and A. F. Khapikov

Institute of Solid State Physics, Russian Academy of Sciences, 142432 Chernogolovka, Moscow District, Russia

A. J. Shapiro and R. D. Shull

Metallurgy Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899

A. Chaiken and R. P. Michel

Materials Science and Technology Division, Lawrence Livermore National Laboratory, Livermore, California 94551

Magnetization reversal processes in epitaxial NiO/NiFe bilayers were studied using the magneto-optic indicator film technique. The influence of dislocations on these processes was determined. Remagnetization parallel to the unidirectional anisotropy axis proceeds by domain nucleation and growth, with nucleation center activity being asymmetric with respect to the applied field sign. Magnetization reversal in the hard axis direction occurs by incoherent rotation. The enhanced coercivity and asymmetric nucleation can be explained by taking into account domain wall behavior in the antiferromagnetic layer.

©1998 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v57/pR8111
DOI: 10.1103/PhysRevB.57.R8111
PACS: 75.70.Cn, 75.30.Et, 75.50.-y, 75.60.-d

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References

1. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956); 105, 904 (1957).
2. M. Takahashi, A. Yanai, S. Taguchi, and T. Suzuki, Jpn. J. Appl. Phys. 19, 1093 (1980) [ INSPEC].
3. O. Massene, R. Montmory, and L. Neel, IEEE Trans. Magn. 1, 63 (1965).
4. M. J. Carey and A. E. Berkowitz, Appl. Phys. Lett. 60, 3060 (1992) [ SPIN][ INSPEC].
5. J. Nogues, D. Lederman, T. J. Moran, and I. K. Schuller, Phys. Rev. Lett. 76, 4624 (1996).
6. P. Grünberg, R. Schreiber, Y. Pang, M. B. Brodsky, and H. Sowers, Phys. Rev. Lett. 57, 2442 (1986).
7. S. S. P. Parkin, N. More, and K. P. Roche, Phys. Rev. Lett. 64, 2304 (1990).
8. J. Unguris, R. J. Celota, and D. T. Pierce, Phys. Rev. Lett. 67, 140 (1991).
9. M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen Van Dau, and F. Petroff, Phys. Rev. Lett. 61, 2472 (1988).
10. B. Dieny, V. S. Speriosu, S. S. P. Parkin, B. A. Gurney, R. D. Wilhoit, and D. Mauri, Phys. Rev. B 43, 1297 (1991).
11. D. Mauri, H. C. Siegmann, P. S. Bagus, and E. Kay, J. Appl. Phys. 62, 3047 (1987) [ SPIN][ INSPEC].
12. A. P. Malozemoff, Phys. Rev. B 35, 3679 (1987); J. Appl. Phys. 63, 3874 (1988) [ SPIN][ INSPEC].
13. A. Berger and H. Hopster, Phys. Rev. Lett. 73, 193 (1994).
14. T. J. Moran, J. M. Galego, and I. K. Schuller, J. Appl. Phys. 78, 1887 (1995) [ SPIN][ INSPEC].
15. N. C. Koon, Phys. Rev. Lett. 78, 4865 (1997).
16. V. S. Gornakov, V. I. Nikitenko, L. H. Bennett, H. J. Brown, M. J. Donahue, W. F. Egelhoff, R. D. McMichael, and A. J. Shapiro, J. Appl. Phys. 81, 5215 (1997) [ INSPEC].
17. V. I. Nikitenko and L. M. Dedukh, Phys. Status Solidi A 3, 383 (1970).
18. R. P. Michel, A. Chaiken, C. T. Wang, and L. E. Johnson, IEEE Trans. Magn. 32, 4651 (1996) [ INSPEC].
19. A. Khapikov, Phys. Rev. Lett. 80, 2209 (1998).

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