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Phys. Rev. Lett. 81, 5832–5835 (1998)

[Issue 26 – 28 December 1998 ]

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Coherent X-Ray Study of Fluctuations during Domain Coarsening

A. Malik¹, A. R. Sandy², L. B. Lurio², G. B. Stephenson¹, S. G. J. Mochrie², I. McNulty³, and M. Sutton⁴

¹Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439

²Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

³Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439

⁴Physics Department, McGill University, Montreal, Quebec H3A 2T8 Canada

We report observations of the dynamics of the exact structure factor (speckle pattern) during phase separation in a sodium borosilicate glass, measured using intensity fluctuation spectroscopy with a coherent x-ray beam. Nonequilibrium fluctuations in the structure factor are analyzed using a two-time correlation function to extract the time-dependent and wave-number-dependent correlation time. The behavior of the correlation time is in agreement with a scaling law previously found in simulations.

©1998 The American Physical Society

URL: http://link.aps.org/abstract/PRL/v81/p5832
DOI: 10.1103/PhysRevLett.81.5832
PACS: 61.10.Eq, 64.60.-i, 64.75.+g

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