Scitation Home | AIP Journal Center | Article Purchases | Table of Contents Alert | Feedback Help | Exit JAP Home Volume: Page/Article: Search Browse Your access to J. Appl. Phys. is provided through the subscription of Central Research Institute. [ Previous / Next Abstract | Issue Table of Contents | Bottom of Page <#bottom> ] Journal of Applied Physics -- June 1, 1998 -- Volume 83, Issue 11, pp. 6290-6292 * Full Text: * [ PDF (75 kB) GZipped PS ] Order ------------------------------------------------------------------------ Permissions for Reuse Exploring magnetic roughness in CoFe thin films J. W. Freeland , V. Chakarian , K. Bussmann , and Y. U. Idzerda / Naval Research Laboratory, Washington, D.C. 20375 / H. Wende / Freie Universität Berlin, D-14195 Berlin-Dahlem, Germany / C.-C. Kao / National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, Upton, New York 11973 / The^ behavior of chemical and magnetic interfaces is explored using diffuse^ x-ray resonant magnetic scattering (XRMS) for CoFe thin films with^ varying interfacial roughnesses. A comparison of the chemical versus magnetic^ interfaces shows distinct differences in the behavior of these two^ related interfaces as the chemical roughness is increased. Such changes^ appear to be correlated with the behavior of the magnetic^ hysteresis of the interface, measured by tracking the diffuse XRMS^ intensity as a function of applied magnetic field. ©/1998 American^ Institute of Physics./ ^ ^ * PII: * S0021-8979(98)17511-4 doi: 10.1063/1.367544 * PACS:* 75.70.Cn, 75.60.Ej, 78.70.Ck, 68.35.Ct Additional Information ------------------------------------------------------------------------ * Full Text: * [ PDF (75 kB) GZipped PS ] Order ------------------------------------------------------------------------ References Citation links [e.g.,_ Phys. Rev. D 40, 2172 (1989)_] go to online journal abstracts. Other links (see Reference Information ) are available with your current login. Navigation of links may be more efficient using a second browser window . 1. J. F. MacKay, C. Teichert, D. E. Savage, and M. G. Lagally, Phys. Rev. Lett. *77*, 3925 (1996) . [ISI] [MEDLINE] 2. Y. U. Idzerda, V. Chakarian, and J. W. Freeland, Synch. Radiat. 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Lett. *73*, 2206 (1998) ------------------------------------------------------------------------ * Full Text: * [ PDF (75 kB) GZipped PS ] Order [ Previous / Next Abstract | Issue Table of Contents | Top of Page <#top> ] [JAP Home ] [All Online Issues: Browse | Search ] [SPIN Database: Search ] [HELP ] [EXIT ] Copyright © 2005 American Institute of Physics Copyright Statement *:* Rights & Permissions *:* Permitted/Prohibited Uses Current Issue All Online Issues Across Journals (SPIN) Multi-Publisher Full Text (CrossRef Search) Current Issue All Online Issues Free Sample Issue Focus & Coverage Editors Editorial Board Editorial Office AIP Production Office Masthead Archive Brochure (PDF) Subscription Prices Back Issues ISSN General Inquiries Subscription Policies Document Delivery Online Access Microform Secure Online Order Form E-mail Customer Service Permitted/Prohibited Uses Online User License Copyright Online Journal License Copying Permission for Other Use Web Posting Guidelines Info for Contributors General Editorial Policies E-mail to Editorial Office Publication Charges Web Posting Guidelines Author Responsibilities Publication Services/Forms E-mail AIP Production Auxiliary Material/EPAPS PACS®