Skip Main Navigation Links ScienceDirect Logo Skip Main Navigation Links Register or Login: Password: Home Browse Search Forms My Alerts My Profile Help (Opens new window) Quick Search: within Quick Search searches abstracts, titles, and keywords. Click for more information. 81 of 82 Result List Previous Next Physica B: Condensed Matter Volume 221, Issues 1-4 , 2 April 1996, Pages 538-541 This Document Abstract PDF (203 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation 0921-4526(95)00977-9 Moments analysis of X-ray reflection profiles F. Rieutorda <#orfa>, * <#cor*>, A. Braslaub <#orfb>, R. Simona <#orfa>, H. J. Lauterc <#orfc> and V. Pasyukc <#orfc> a CEA/Département de Recherche Fondamentale sur la Matière Condensée, SP2M/PI 38054 Grenoble Cédex 9 France b CEA/Service de Physique de l'Etat Condensé, Orme des Merisiers 91191 Gif-sur-Yvette Cédex France c Institut Laue-Langevin, BP 156X F-38042 Grenoble Cédex France Available online 12 February 1999. Abstract We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile. * <#bcor*>Corresponding author. This Document Abstract PDF (203 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation Physica B: Condensed Matter Volume 221, Issues 1-4 , 2 April 1996, Pages 538-541 81 of 82 Result List Previous Next Home Browse Search Forms My Alerts My Profile Help (Opens new window) ScienceDirect Logo Send feedback to ScienceDirect Software and compilation © 2002 ScienceDirect. All rights reserved. ScienceDirect® is an Elsevier Science B.V. registered trademark. Your use of this service is governed by Terms and Conditions . Please review our Privacy Policy for details on how we protect information that you supply.