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0039-6028(95)01198-6

Growth and structure of Cr ultra-thin films deposited on Co(0001)

F. Scheurer^{a, *}, P. Ohresser^a, B. Carrière^a, J. P. Deville^a and A. Dobroiu<sup>b

a</sup> Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 046, 23 rue du Loess F-67037 Strasbourg Cedex France
^b Institutul de Fizica Aromica BP MG 6 76900 Bucuresti-Magurele Romania

Received 5 September 1995; accepted 31 October 1995. Available online 6 April 2000.

Abstract

The growth and structure of ultra-thin Cr films deposited on a Co(0001) single crystal are investigated for substrate temperatures ranging from 300 to 500 K by means of Auger electron spectroscopy, low energy electron diffraction and photoemission. For room temperature growth, the interface is sharp and the Cr layers arrange in a Nishiyama-Wassermann-type epitaxy. At elevated temperatures the interface is diffuse and a Kurdjumov-Sachs orientation is observed.

Author Keywords: Chromium; Cobalt; Epitaxy; Growth; Magnetic films; Surface structure

^*Corresponding author.

	This document Abstract Journal Format-PDF (315 K) Actions Cited By Save as Citation Alert Export Citation Surface Science Volumes 352-354 15 May 1996 Pages 567-571

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