Volume: Page/Article: ------------------------------------------------------------------------ Article Collection: View Collection Help (Click on the Check Box to add an article.) ------------------------------------------------------------------------ Phys. Rev. B 51, 2239?2251 (1995) [Issue 4 ? 15 January 1995 ] [ Previous article | Next article | Issue 4 contents ] Add to article collection View Page Images or PDF (2251 kB) ------------------------------------------------------------------------ X-ray diffraction from laterally structured surfaces: Total external reflection M. Tolan and W. Press Institut für Experimentalphysik, Christian-Albrechts-Universität Kiel, Olshausenstrasse 40, 24098 Kiel, Germany F. Brinkop and J. P. Kotthaus Sektion Physik, Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, 80539 München, Germany Received 8 August 1994 In this work x-ray-diffraction measurements from GaAs surface gratings are presented. The experiments were performed using a three-crystal diffractometer. Measurements in the region of total external reflection (small incidence angles) for five samples were done and compared with model calculations based on a dynamical scattering theory. The theory is able to explain all experiments quantitatively. Mesoscopic grating parameters as well as microscopic surface roughnesses of the samples were obtained from fits of the data. For three samples scanning-electron-microscope pictures were taken. The analysis of these pictures leads to the same mesoscopic parameters as obtained from x-ray diffraction. ©1995 The American Physical Society URL: http://link.aps.org/abstract/PRB/v51/p2239 DOI: 10.1103/PhysRevB.51.2239 PACS: 61.10.Dp, 61.10.Lx, 68.35.-p ------------------------------------------------------------------------ Add to article collection View Page Images or PDF (2251 kB) [ Previous article | Next article | Issue 4 contents ] ------------------------------------------------------------------------ References (Reference links marked with dot may require a separate subscription.) 1. H. Dosch, Critical Phenomena at Surfaces and Interfaces (Evanescent X-Ray and Neutron Scattering), Springer Tracts in Modern Physics Vol. 126 (Springer-Verlag, Berlin, 1992). 2. R. W. James, The Optical Principles of the Diffraction of X-Rays (Ox Bow Press, Woodbridge, 1982). 3. S. R. Andrews and R. A. Cowley, J. Phys. C 18, 6427 (1985) [dot INSPEC ]. 4. I. K. Robinson, Phys. Rev. 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