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Phys. Rev. B 52, 9917–9924 (1995)

[Issue 14 – 1 October 1995 ]

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Observation and explanation of one-dimensional x-ray speckle patterns from synthetic multilayers

I. K. Robinson

University of Illinois, Urbana, Illinois 61801

R. Pindak and R. M. Fleming

AT&T Bell Laboratories, Murray Hill, New Jersey 07974

S. B. Dierker

University of Michigan, Ann Arbor, Michigan 48109

K. Ploog

Paul-Drude-Institüt für Festkörperelektronik, D-10117 Berlin, Germany

G. Grübel, D. L. Abernathy, and J. Als–Nielsen

European Synchrotron Radiation Facility, 38043 Grenoble, France

Using the new ``Troika'' x-ray undulator beamline at the European Synchrotron Radiation Facility, we have succeeded in measuring coherent diffraction (``speckle'') patterns from artificial multilayers. The patterns are unusual in that they are unremarkable in the scan direction perpendicular to the Bragg angle, showing a single peak of the width of the Fraunhofer maximum, but have dramatic structure in the direction of the Bragg angle. This is shown to be consistent with the extreme asymmetry of the geometry that causes more than one well-ordered domain of the sample to fall within the coherently illuminated region. The patterns are sufficiently simple that we are able to model them reasonably well by fitting explicit phase parameters to a fixed number of illuminated ``blocks.'' Two fitting procedures are described that may have some general utility.

©1995 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v52/p9917
DOI: 10.1103/PhysRevB.52.9917
PACS: 42.30.-d, 61.10.-i, 68.55.-a, 78.70.-g

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