Skip Main Navigation Links ScienceDirect Logo Skip Main Navigation Links Register or Login: Password: Home Browse Search Forms My Alerts My Profile Help (Opens new window) Quick Search: within Quick Search searches abstracts, titles, and keywords. Click for more information. 41 of 112 Result List Previous Next Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 359, Issues 1-2 , 1 May 1995, Pages 175-177 This Document Abstract PDF (172 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation 0168-9002(94)01693-3 The application of the X-ray standing wave method to study Ni/C layered structures obtained by laser-assisted deposition V. A. Chernovb <#orfb>, * <#cor*>, N. I. Chkhaloa <#orfa>, I. P. Dolbnyaa <#orfa> and K. V. Zolotareva <#orfa> a Budker Institute of Nuclear Physics Novosibirsk Russian Federation b Institute of Catalysis 630090 Novosibirsk Russian Federation Available online 23 February 2000. Abstract The X-ray standing wave method using fluorescence yield mode was applied to study the profile of the component-by-component distribution between Ni and C layers in Ni/C layered structures produced by laser-assisted deposition. The method of recurrent relationships was used to calculate the standing wave electric field profile, and to reconstruct the Ni deep distribution. Best fitting was obtained if the intermixing thickness was equal to 3-4 å. * <#bcor*>Corresponding author. This Document Abstract PDF (172 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 359, Issues 1-2 , 1 May 1995, Pages 175-177 41 of 112 Result List Previous Next Home Browse Search Forms My Alerts My Profile Help (Opens new window) ScienceDirect Logo Send feedback to ScienceDirect Software and compilation © 2002 ScienceDirect. All rights reserved. ScienceDirect® is an Elsevier Science B.V. registered trademark. Your use of this service is governed by Terms and Conditions . Please review our Privacy Policy for details on how we protect information that you supply.