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Phys. Rev. Lett. 70, 57?60 (1993)
[Issue 1 ? 4 January 1993 ]
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Scanning tunneling microscopy observation of self-affine fractal
roughness in ion-bombarded film surfaces
J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede
Laboratorium voor Vaste-Stof-Fysika en Magnetisme, Katholieke
Universiteit Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium
Received 26 May 1992
We describe a straightforward method for obtaining a precise value for
the fractal dimension (self-affine scaling exponent) of a surface, via
scanning tunneling microscopy. It is applied to investigate ion-beam
erosion of an iron film surface, provoding strong support for the
applicability of scaling theory to submicron erosion processes. A
self-affine surface with scaling exponent H=0.53ą0.02 is observed to
develop.
Š1993 The American Physical Society
URL: http://link.aps.org/abstract/PRL/v70/p57
DOI: 10.1103/PhysRevLett.70.57
PACS: 68.55.Jk, 68.35.Bs, 79.20.Rf
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