Volume: Page/Article: ------------------------------------------------------------------------ Article Collection: View Collection Help (Click on the Check Box to add an article.) ------------------------------------------------------------------------ Phys. Rev. B 47, 15896?15903 (1993) [Issue 23 ? 15 June 1993 ] [ Previous article | Next article | Issue 23 contents ] Add to article collection View Page Images or PDF (1237 kB) ------------------------------------------------------------------------ X-ray reflection from rough layered systems V. Holý, J. Kubena, and I. Ohlídal Department of Solid State Physics, Faculty of Science, Masaryk University, Kotlarska 2, 611 37 Brno, Czech Republic K. Lischka and W. Plotz Institute of Optoelectronics, Kepler University, Altenbergerstrasse 69, 4040 Linz, Austria Received 15 September 1992 The specular and nonspecular x-ray reflectivity of a rough multilayer is calculated on the basis of the distorted-wave Born approximation. The theory explains the existence of maxima in the angular distribution of a nonspecularly reflected wave. The interface roughness has been characterized by root-mean-square roughness, lateral correlation length, and the fractal dimension of the interface. It has been demonstrated that these parameters can be obtained from nonspecular reflectivity mreasurements. Calculations based on this theory compare well with data measured on rough layered samples. ©1993 The American Physical Society URL: http://link.aps.org/abstract/PRB/v47/p15896 DOI: 10.1103/PhysRevB.47.15896 PACS: 78.66.-w ------------------------------------------------------------------------ Add to article collection View Page Images or PDF (1237 kB) [ Previous article | Next article | Issue 23 contents ] ------------------------------------------------------------------------ References (Reference links marked with dot may require a separate subscription.) 1. G. Parrat, Phys. Rev. 95, 359 (1964) . 2. D. E. Savage, J. Kleiner, N. Schimke, Y. H. Phang, T. Jankowski, J. Jacobs, R. Kariotis and M. G. Lagally, J. Appl. Phys. 69, 1411 (1991) [dot INSPEC ]. 3. D. E. Savage, N. Schimke, Y. H. Phang and M. G. Lagally, J. Appl. Phys. 71, 3283 (1992) [dot INSPEC ]. 4. D. K. G. de Boer, Phys. Rev. B 44, 489 (1991) . 5. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980) [dot INSPEC ]. 6. B. Vidal and P. Vincent, Appl. Opt. 23, 1794 (1984) [dot SPIN ][dot INSPEC ]. 7. B. Pardo, T. Megademini and J. M. André, Rev. Phys. Appl. 23, 1579 (1988) [dot INSPEC ]. 8. Y. Yoneda, Phys. Rev. 131, 2010 (1963) . 9. O. J. Guentert, J. Appl. Phys. 30, 1361 (1965). 10. A. N. Nigam, Phys. Rev. A 4, 1189 (1965). 11. J. B. Kortright, J. Appl. Phys. 70, 3620 (1991) [dot INSPEC ]. 12. S. K. Sinha, E. B. Sirota, S. Garoff and H. B. Stanley, Phys. Rev. B 38, 2297 (1988) . 13. R. G. Newton, Scattering Theory of Waves and Particles (McGraw Hill, New York, 1966). 14. H. S. W. Massey, Rev. Mod. Phys. 28, 199 (1956) . 15. M. K. Sanyal, S. K. Sinha, K. G. Huang and B. M. Ocko, Phys. Rev. Lett. 66, 628 (1991) ; I. M. Tidswell, T. A. Rabedeau, P. S. Pershan and S. D. Kosowsky, , 2108 (1991) . 16. B. B. Mandelbrodt, The Fractal Geometry of Nature (Freeman, New York, 1982), and citations therein. ------------------------------------------------------------------------ Add to article collection View Page Images or PDF (1237 kB) [Show Articles Citing This One] Requires Subscription [ Previous article | Next article | Issue 23 contents ] ------------------------------------------------------------------------ [ APS | APS Journals | PROLA Homepage | Browse | Search ]