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The Journal of Chemical Physics -- October 15, 1992 -- Volume 97, Issue 8, pp. 5824-5836

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Surface scattering of x rays in thin films. Part I. Theoretical treatment

J. Daillant and O. Bélorgey
Service de Physique de l'Etat Condensé, Orme des Merisiers, Centre d'études de Saclay, 91191 Gif-Sur-Yvette CEDEX, France

(Received 6 February 1992; accepted 30 June 1992)

The diffuse scattering of x rays by thin films limited by rough interfaces is presented theoretically in terms of height–height correlation functions. The method employed, analogous to the use of Green functions, allows a rigourous treatment down to grazing incidences. An expression for the scattered intensity is obtained from the scattering cross section. The results are then discussed using a model correlation function, and the interpretation of x-ray reflectivity experiments is reexamined. We show that off-specular scans yield direct information about the correlations between interfaces which, in case of liquid thin films, can be used to determine elastic parameters. The generalized case of stratified media is examined in an appendix. This theory is compared to experimental results in the case of soap films in a companion article. The Journal of Chemical Physics is copyrighted by The American Institute of Physics.


DOI: 10.1063/1.463741
PACS: 61.10.Dp, 68.15.+e, 68.35.-p        Additional Information


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