[ ] [Image] [ ] Volume: Page/Article: ------------------------------------------------------------------------ Article Collection: View Collection Help (Click on the [Check Box] to add an article.) ------------------------------------------------------------------------ Phys. Rev. B 40, 8256–8269 (1989) [Issue 12 – 15 October 1989 ] [ Previous article | Next article | Issue 12 contents ] [Add to article collection] View Page Images or PDF (2319 kB) ------------------------------------------------------------------------ Structural studies of Co/Cr multilayered thin films M. B. Stearns, C. H. Lee, and T. L. Groy Department of Physics, Arizona State University, Tempe, Arizona 85287 Received 20 June 1988 The structural properties of Co/Cr multilayered structures (ML's) with bilayer thickness varying from 14 to 400 A-ring and total thickness of about 3000 A-ring have been studied. These ML's were prepared by e-beam vapor deposition of the elemental metals onto temperature-controlled oxidized single-crystal Si substrates. Several sets of multilayers were fabricated in order to investigate various types of effects. It was determined that the multilayer crystallites grow as bcc Cr layers in the [110] direction and hcp Co layers in the [10.1] direction. Crystallites of hcp [00.2] Co and/or [110] Cr and [10.0] Co also occur systematically in some of the ML. The detailed structures of the ML's (the individual layer, bilayer, and interface thicknesses as well as the length of the various crystallites) were determined by modeling the multilayers as having interfaces with a linear variation in composition and fitting the measured large-angle x-ray-scattering spectra to calculated spectra. This analysis indicates that the bilayers of the ML crystallites have asymmetric interfaces as would result from the rate of diffusion or penetration of the Co into Cr being much larger than that of Cr into Co. There is no evidence for any bcc Co. The growth of the ML can be described by three empirical rules. The interface thicknesses of a few ML's having complete alignment were also determined from saturation-magnetization measurements; the two methods gave good agreement. ©1989 The American Physical Society URL: http://link.aps.org/abstract/PRB/v40/p8256 DOI: 10.1103/PhysRevB.40.8256 PACS: 68.65.+g, 75.70.-i, 75.50.Rr ------------------------------------------------------------------------ [Add to article collection] View Page Images or PDF (2319 kB) [ Previous article | Next article | Issue 12 contents ] ------------------------------------------------------------------------ References (Reference links marked with [dot] may require a separate subscription.) 1. See, for example, D. B. McWhan, Synthetic Modulated Structures, edited by L. L. Chang and B. C. Giessen (Academic, New York, 1985). 2. E. Bauer and J. H. van der Merwe, Phys. Rev. B 33, 3657 (1986). 3. S. A. Chambers, T. J. Wagener and J. H. Weaver, Phys. Rev. B 36, 8992 (1987). 4. R. Kern, G. LeLay and J. J. Metois, Curr. Top. Mater. Sci. 3, 130 (1979). 5. M. B. Stearns, Phys. Rev. B 38, 8109 (1988). 6. J. A. Venables, G. D. T. Spiller and M. Hanbucken, Rep. Prog. Phys. 47, 399 (1984) [[dot] INSPEC]. 7. J. K. MacKenzie, A. J. W. Moore and J. F. Nicholas, J. Phys. Chem. Solids, 23, 185 (1962). 8. F. J. A. den Broeder, D. Kuiper, A. P. van de Mosselaer and W. Hoving, Phys. Rev. Lett. 60, 2769 (1988). 9. C. H. Lee, H. He, F. Lamelas, W. Vavra, C. Uher and R. Clarke, Phys. Rev. Lett. 62, 653 (1989). 10. M. B. Stearns, C. H. Lee, C.-H. Chang, and A. K. Petford-Long, in Metallic Multilayers and Epitaxy, edited by M. Hong, S. Wolf, and D. C. Gubser (The Metallurgical Society of AIME, Denver, CO, 1988). 11. A. Segmuller and A. E. Blakeslee, J. Appl. Crystallogr. 6, 19 (1973) [ [dot] INSPEC]. 12. D. B. McWhan, M. Gurvitch, J. M. Rowell and L. R. Walker, J. Appl. Phys. 54, 3886 (1983) [[dot] SPIN][[dot] INSPEC]. 13. A. K. Petford-Long, M. B. Stearns, C.-H. Chang, S. R. Nutt, D. G. Stearns, N. M. Ceglio and A. M. Hawryluk, J. Appl. Phys. 61, 1422 (1987) [[dot] SPIN][[dot] INSPEC]. 14. S.-C. Y. Tsen, M. B. Stearns, and D. J. Smith (unpublished). 15. Joint Committee on Powder Diffraction Standards Files, International Center for Diffraction Data, Swarthmore, PA 1988. 16. T. Wielinga, J. C. Lodder and J. Worst, IEEE Trans. Magn. MAG-18, 1107 (1982) [[dot] INSPEC]; and, Thin Solid Films 101, 61 (1983) [[dot] INSPEC]. 17. J. Q. Zheng, J. B. Ketterson and G. P. Felcher, J. Appl. Phys. 53, 3624 (1982) [[dot] SPIN][[dot] INSPEC]. 18. D. J. Webb, R. G. Walmsley, K. Parvin, P. H. Dickinson, T. H. Geballe and R. M. White, Phys. Rev. B 32, 4667 (1985). 19. M. B. Stearns, C. H. Lee and S. P. Vernon, J. Magn. Magn. Mater. 54-57, 791 (1986). 20. I. K. Schuller, Phys. Rev. Lett. 44, 1597 (1980). 21. A. Walmsley, J. Thompson, D. Friedman, R. W. White and T. H. Geballe, IEEE Trans. Magn. MAG-19, 1992 (1983) [[dot] INSPEC]. 22. H. Hahn and R. S. Averback, Phys. Rev. B 37, 6533 (1988). 23. R. M. Bozorth, Ferromagnetism (Van Nostrand, New York, 1951). 24. A. K. Petford-Long, N. J. Long, and M. B. Stearns (unpublished). ------------------------------------------------------------------------ [Add to article collection] View Page Images or PDF (2319 kB) [Show Articles Citing This One] Requires Subscription [ Previous article | Next article | Issue 12 contents ] ------------------------------------------------------------------------ [ APS | APS Journals | PROLA Homepage | Browse | Search ]