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Phys. Rev. Lett. 44, 1597–1600 (1980)

[Issue 24 – 16 June 1980 ]

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New Class of Layered Materials

Ivan K. Schuller

Solid State Science Division, Argonne National Laboratory, Argonne, Illinois 60439

A new class of layered materials has been prepared by alternate deposition of two dissimilar metals. Strong experimental evidence is shown that coherent structures with layer thicknesses approaching interatomic spacing can be prepared in this fashion. The experimental x-ray measurements are found to be in good qualitative and quantitative agreement with model calculations.

©1980 The American Physical Society

URL: http://link.aps.org/abstract/PRL/v44/p1597
DOI: 10.1103/PhysRevLett.44.1597
PACS: 68.55.+b, 73.60.Ka

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References

1. J. E. Hilliard, in Modulated Structures—1979, edited by J. M. Cowley, J. B. Cohen, M. B. Salamon, and B. J. Wuensch, AIP Conference Proceedings No. 53 (American Institute of Physics, New York, 1979), p. 407.
2. A. C. Gossard, Thin Solid Films 57, 3 (1979); Armin Segmüller, P. Krishna, and L. Esaki, J. Appl. Crystallogr. 10, 1 (1977) [ INSPEC].
3. Ivan K. Schuller and C. M. Falco, in Inhomogeneous Superconductors—1979, edited by D. U. Gubser, T. L. Francavilla, S. A. Wolf, and J. R. Leibowitz, AIP Conference Proceedings No. 58 (American Institute of Physics, New York, 1979).
4. M. M. Woolfson, An Introduction to X-Ray Crystallography (Cambridge Univ. Press, London, 1970).
5. Omitted endnote.
6. L. A. Bruce and H. Jaeger, Philos. Mag. A 38, 223 (1978) [ INSPEC].
7. P. Entel and M. Peter, J. Low Temp. Phys. 22, 613 (1976) [ INSPEC].

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