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Phys. Rev. Lett. 43, 935–938 (1979)

[Issue 13 – 24 September 1979 ]

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Evidence for a Clean (sqrt[2] x sqrt[2])R 45° Surface Structure on Cr(100)

G. Gewinner, J. C. Peruchetti, A. Jaegle, and R. Riedinger

Laboratoire de Physique et de Spectroscopie Electronique, Institut des Sciences Exactes et Appliquées, Université de Haute Alsace, Mulhouse, France

Low-energy electron diffraction observations of carefully cleaned and annealed Cr(100) surfaces show a sharp and intense (sqrt[2] x sqrt[2])R45° structure. Auger-electron spectroscopy measurements indicate that this "anomalous" structure is actually a clean-surface effect. A strong contamination-sensitive feature is revealed by angle-resolved photoemission and it is suggested that reconstruction results from an instability connected with a peak near E_F in the surface density of states of the Cr(100) (1 x 1) surface.

©1979 The American Physical Society

URL: http://link.aps.org/abstract/PRL/v43/p935
DOI: 10.1103/PhysRevLett.43.935

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