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Phys. Rev. 95, 359–369 (1954)

[Issue 2 – 15 July 1954 ]

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Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt

Cornell University, Ithaca, New York

Analysis of the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection provides a new method of studying certain structural properties of the mirror surface about 10 to several hundred angstroms deep. Dispersion theory, extended to treat any (small) number of stratified homogeneous media, is used as a basis of interpretation.

Curves for evaporated copper on glass at room temperature are studied as an example. These curves may be explained by assuming that the copper (exposed to atmospheric air at room temperature) has completely oxidized about 150A deep. If oxidation is less deep, there probably exists some general reduction of density (e.g., porosity) and an electron density minimum just below an internal oxide seal. This seal, about 25A below the nominal surface plane, arrests further oxidation of more deeply-lying loose-packed copper crystallites.

All measurements to date have been carried out under laboratory atmospheric conditions which do not allow satisfactory separation or control of the physical and chemical variables involved in the surface peculiarities. The method, under more controlled conditions of preparation and treatment of the surface, promises to be useful.

©1954 The American Physical Society

URL: http://link.aps.org/abstract/PR/v95/p359
DOI: 10.1103/PhysRev.95.359

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References

1. A. H. Compton and S. K. Allison, X-Rays in Theory and Experiment (D. Van Nostrand Company, Inc., New York, 1935), p. 307.
2. L. G. Parratt and C. F. Hempstead, Phys. Rev. 94, 1593 (1954) .
3. Omitted endnote.
4. [Parratt, Hempstead, and Jossem, Rev. Sci. Instr. 23, 1 (1952)].
5. C. M. Lucht and D. Harker, Rev. Sci. Instr. 22, 392 (1951).
6. [R. C. Williams and R. C. Backus, J. Appl. Phys. 20, 98 (1949)]; [O. S. Heavens, Proc. Phys. Soc. (London) B64, 419 (1951)]; W. Ehrenberg, J. Opt. Soc. Am. 39, 746 (1949).
7. H. Kiessig, Ann. Physik 10, 715 (1931).
8. H. Levinstein, J. Appl. Phys. 20, 306 (1949).
9. reference 7; A. J. Lameris and J. A. Prins, Physica 1, 881 (1934).
10. Omitted endnote.
11. H. Kiessig, Ann. Physik 10, 769 (1931); F. Odenbach, Ann. Physik 38, 469 (1940); R. Riedmiller, Ann. Physik 20, 377 (1934).
12. Omitted endnote.
13. M. S. Blois, Jr., and L. M. Rieser, Jr., J. Appl. Phys. 25, 338 (1954).
14. A. H. White and L. H. Germer, Trans. Electrochem. Soc. 81, 305 (1942); W. E. Campbell and U. B. Thomas, Trans. Electrochem. Soc. 91, 623 (1947).
15. Omitted endnote.
16. W. E. Campbell and U. B. Thomas, Trans. Electrochem. Soc. 76, 303 (1939).
17. Omitted endnote.
18. O. Beeck, Revs. Modern Phys. 17, 61 (1945).
19. Omitted endnote.
20. H. Kiessig, reference 7; references 11 and 13; R. W. James, The Optical Principles of the Diffraction of X-Rays (G. Bell and Sons, Ltd., London, 1950), pp. 171-177.
21. Omitted endnote.
22. Garner, Gray, and Stone, Proc. Roy. Soc. (London) A197, 294 (1949); Disc. Faraday Soc. No. 8, 246 (1950); M. Bound and D. A. Richards, Proc. Phys. Soc. (London) 51, 256 (1939).
23. F. C. Frank and J. H. van der Merwe, Proc. Roy. Soc. (London) A200, 125 (1950); K. Leu, Ph.D. thesis, University of London, 1951 (unpublished); H. Frisby, Compt. rend. 226, 572 (1948); 228, 1291 (1949).
24. K. Hauffe, Prog. Metal Phys. 4, 71 (1953).
25. J. A. Allen and J. W. Mitchell, Disc. Faraday Soc. No. 8, 309 (1950).
26. Beeck, Cole, and Wheeler, Disc. Faraday Soc. No. 8, 314 (1950).
27. R. Gomer and C. S. Smith, Structure and Properties of Solid Surfaces (The University of Chicago Press, Chicago, 1953).
28. Omitted endnote.
29. Omitted endnote.

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