Volume: Page/Article:


      Phys. Rev. 59, 693?698 (1941)


      [Issue 9 ? 1 May 1941 ]

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      X-Ray Diffraction in Random Layer Lattices

    B. E. Warren
    George Eastman Laboratory of Physics, Massachusetts Institute of
    Technology, Cambridge, Massachusetts

Received 7 March 1941

Random layer lattice structures are considered which consist of layers
arranged parallel and equidistant, but random in translation parallel to
the layer, and rotation about the normal. We call a and b the axes in
the layer, and c the axis normal to the layer. In this notation there
will be crystalline reflections of type (00l), two-dimensional lattice
reflections of type (hk), and no general reflections (hkl). Equations
are developed for the intensity distribution in a two-dimensional powder
reflection, and for the integrated intensity. Equations are also
de-developed for the particle size in terms of the peak breadth, and for
the displacement of the peak. The powder pattern of a heat treated
carbon black is presented as an illustration of two-dimensional lattice
reflections.

©1941 The American Physical Society

URL: http://link.aps.org/abstract/PR/v59/p693
DOI: 10.1103/PhysRev.59.693

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      References

(Reference links marked with dot may require a separate subscription.)

   1. M. v. Laue, Zeits. f. Krist. 82, 127 (1932).
   2. U. Hofmann and D. Wilm, Zeits. f. Electrochemie 42, 504 (1936); H.
      Arnfeld, Arkiv f. Mat. Astron. Fys. B23, 1 (1932); E. Berl, K.
      Andress, L. Reinhardt and W. Herbert, Zeits. f. physik. Chemie
      A158, 273 (1932); A166, 81 (1933).


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