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Physical Review A
(Atomic, Molecular, and Optical Physics)

Phys. Rev. A 69, 023813 (2004) (9 pages)
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Intensity interferometry for the study of x-ray coherence

M. Yabashi
SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan
K. Tamasaku and T. Ishikawa
SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan

(Received 30 September 2003; published 26 February 2004)

Intensity interferometry has been performed for the study of x-ray coherence. A high-resolution monochromator at E = 14.41 keV was developed for enhancing the interference signal. Transverse coherence profiles of undulator radiation were evaluated from measurements of mode numbers. The obtained coherence length in vertical, which is perpendicular to the scattering plane of the monochromator, was proportional to the distance from the light source, as is expected from the Van Cittert–Zernike theorem. Vertical emittances of the storage ring were determined from the measured coherence lengths. Degradation of transverse coherence with phase object was measured and analyzed based on the propagation law of mutual intensity. ©2004 The American Physical Society

URL: http://link.aps.org/abstract/PRA/v69/e023813
doi:10.1103/PhysRevA.69.023813
PACS: 42.50.Ar, 41.50.+h, 07.85.Qe        Additional Information

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