Your access to Phys. Rev. B is provided through the subscription of Central Research Institute.

[ Previous / Next Abstract | Issue Table of Contents | Bottom of Page ]

Physical Review B (Condensed Matter and Materials Physics -15(I)) Phys. Rev. B 69, 195307 (2004) (8 pages)

Choose an action ------------------------- Add to: - myArticles ------------------------- Download Citation(s) in: - BibTeX - EndNote ® (generic) - EndNote ® (RIS) - Medline - Plain Text - RefWorks ------------------------- View Citation(s) in: - BibTeX - EndNote ® (generic) - EndNote ® (RIS) - Medline - Plain Text - RefWorks

Strain determination in multilayers by complementary anomalous x-ray diffraction

T. U. Schülli,^1,2 R. T. Lechner,¹ J. Stangl,¹ G. Springholz,¹ G. Bauer,¹ M. Sztucki,² and T. H. Metzger²

¹Institute for Semiconductor Physics, Johannes Kepler Universität Linz, A-4040 Linz, Austria
²European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France

(Received 19 November 2003; revised 24 February 2004; published 20 May 2004)

A method to determine selectively the lattice parameters and the strain in multilayers is developed, based on x-ray diffraction, using two wavelengths close to the absorption edges of different elements. This allows for a complementary suppression of the constituent materials in the multilayer. The method is applied to a study of single crystal multilayers of EuSe and PbSeTe grown by solid source molecular-beam epitaxy. The enhancement of the chemical contrast by anomalous x-ray diffraction and the high resolution is exploited to achieve a sensitivity for interdiffusion on an angstrom scale. ©2004 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v69/e195307
doi:10.1103/PhysRevB.69.195307
PACS: 68.65.-k, 61.10.Eq        Additional Information

References

1. P. Zaumseil, X-ray Diffraction Techniques, Vol. 45, edited by R. K. Willardson and A.C. Beer, Semiconductors and Semimetals (Academic, New York, 1997), p. 261.
   
2. V. Holý, U. Pietsch, and T. Baumbach, High Resolution X-ray Diffraction from Thin Films and Multilayers, Vol. 149, edited by G. Höhler, Springer Tracts in Modern Physics (Springer, Berlin, 1999).
   
3. K.K.-W. Siu, A.Y. Nikulin, P. Zaumseil, H. Yamazaki, and T. Ishikawa, J. Appl. Phys. 94, 1007 (2003). [ISI]
   
4. I.N. Goncharenko and I. Mirebeau, Phys. Rev. Lett. 80, 1082 (1998). [ISI]
   
5. H. Kepa, G. Springholz, T.M. Giebultowicz, K.I. Goldman, C.F. Majkrzak, P. Kacman, J. Blinowski, S. Holl, H. Krenn, and G. Bauer, Phys. Rev. B 68, 024419 (2003).
   
6. P. Wachter, Handbook on the Physics and Chemistry of Rare Earths, edited by K.A. Gschneidner and L. Eyring (North-Holland, Amsterdam, 1979), p. 507.
   
7. H. Kepa, J. Kutner-Pielaszek, J. Blinowski, A. Twardowski, C.F. Majkrzak, T. Story, P. Kacman, R.R. Galazka, K. Ha, H.J.M. Swagten, W.J.M. de Jonge, A.Yu. Sipatov, V. Volobuyev, and T.M. Giebultowicz, Europhys. Lett. 56, 54 (2001). [Inspec]
   
8. T.U. Schülli, M. Sztucki, V. Chamard, T.H. Metzger, and D. Schuh, Appl. Phys. Lett. 81, 448 (2002). [ISI]
   
9. J. Baró, M. Roteta, J.M. Fernández-Varea, and F. Salvat, Radiat. Phys. Chem. 44, 531 (1994). [ISI]
   
10. B.L. Henke, E.M. Gullikson, and J.C. Davis, At. Data Nucl. Data Tables 54, 181 (1993). [Inspec] [ISI]
    
11. L. Kissel, B. Zhou, S.C. Roy, S.K. Sen Gupta, and R.H. Pratt, Acta Crystallogr., Sect. A: Found. Crystallogr. 51, 271 (1995). [Inspec] [ISI]
    
12. See, www-phys.llnl.gov
    
13. R.T. Lechner (unpublished).
    
14. M. Born and E. Wolf, Principles of Optics, Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge University Press, Cambridge, 1997).
    
15. J.M. Cowley, Diffraction Physics (North-Holland, Amsterdam, 1981).
    
16. R. Hosemann, Z. Phys. 127, 16 (1949).
    
17. D.G. Stearns, J. Appl. Phys. 65, 491 (1989). [ISI]
    
18. G. Nimtz, in Numerical Data and Functional Relationships in Science and Technology, edited by K. Hellwege and O. Madelung, Landolt-Börnstein, New Series, Group III, Vol. 17 Pt. f (Springer-Verlag, Berlin, 1993), p. 168.
    
19. D.G. Stearns, J. Appl. Phys. 71, 4286 (1992). [ISI]
    
20. J.H. Li, S.C. Moss, Y. Zhang, A. Mascarenhas, L.N. Pfeiffer, K.W. West, W.K. Ge, and J. Bai, Phys. Rev. Lett. 91, 106103 (2003).
    
21. G. Springholz, V. Holy, M. Pinczolits, and G. Bauer, Science 282, 734 (1998). [ISI]
    

  The American Physical Society is a member of CrossRef.

Citing Articles

1. Strain Induced Changes in the Magnetic Phase Diagram of Metamagnetic Heteroepitaxial EuSe/PbSe_1-xTe_x Multilayers
   R. T. Lechner et al., Phys. Rev. Lett. 94, 157201 (2005)