Vol Page/Article: Your access to Phys. Rev. B is provided through the subscription of Central Research Institute. [ Previous / Next Abstract | Issue Table of Contents | Bottom of Page <#bottom> ] ------------------------------------------------------------------------ *Physical Review B (Condensed Matter and Materials Physics -1(II)) * Phys. Rev. B *68*, 224409 (2003) /(19 pages)/ * Full Text: * [ PDF (609 kB) GZipped PS Order Document ] ------------------------------------------------------------------------ X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. I. Specular reflectivity D. R. Lee / Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA / S. K. Sinha / Department of Physics, University of California, San Diego, La Jolla, California 92093, USA Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA / D. Haskel , Y. Choi , J. C. Lang , S. A. Stepanov , and G. Srajer / Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA / (Received 9 May 2003; published 10 December 2003) The^ theoretical formulation of x-ray resonant magnetic scattering from rough surfaces^ and interfaces is given for specular reflectivity. A general expression^ is derived for both structurally and magnetically rough interfaces in^ the distorted-wave Born approximation as the framework of the theory.^ For this purpose, we have defined a "structural" and a^ "magnetic" interface to represent the actual interfaces. A generalization of^ the well-known Nevot-Croce formula for specular reflectivity is obtained for^ the case of a single rough magnetic interface using the^ self-consistent method. Finally, the results are generalized to the case^ of multiple interfaces, as in the case of thin films^ or multilayers. Theoretical calculations for each of the cases are^ illustrated with numerical examples and compared with experimental results of^ magnetic reflectivity from a Gd/Fe multilayer. ©2003 /The American Physical Society/ ^ ^ * URL: * http://link.aps.org/abstract/PRB/v68/e224409 doi: 10.1103/PhysRevB.68.224409 * PACS:* 75.70.Cn, 61.10.Kw Additional Information View ISI's Web of Science data for this article: [ Source Abstract | Related Articles ] See Also * X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. II. Diffuse scattering D. R. Lee /et al./ Phys. Rev. B *68*, 224410 (2003) ------------------------------------------------------------------------ * Full Text: * [ PDF (609 kB) GZipped PS Order Document ] ------------------------------------------------------------------------ References Citation links [e.g.,_ Phys. Rev. D 40, 2172 (1989)_] go to online journal abstracts. 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[ISI] The American Physical Society is a member of CrossRef . ------------------------------------------------------------------------ * Full Text: * [ PDF (609 kB) GZipped PS Order Document ] ------------------------------------------------------------------------ Citing Articles This list contains links to other online articles that cite the article currently being viewed. 1. X-ray natural birefringence in reflection from graphite H.-Ch. Mertins /et al./, Phys. Rev. B *70*, 235106 (2004) 2. Temperature evolution of the Gd magnetization profile in strongly coupled Gd/Fe multilayers Y. Choi /et al./, Phys. Rev. B *70*, 134420 (2004) 3. Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering B. M. Barnes /et al./, J. Appl. Phys. *95*, 6654 (2004) 4. X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. II. Diffuse scattering D. R. Lee /et al./, Phys. Rev. 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