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10.1016/S0168-583X(01)01208-3
PII: S0168-583X(01)01208-3
Copyright © 2002 Elsevier Science B.V. All rights reserved.


    Hyperfine interaction studies with monolayer depth resolution using
    ultra-low energy radioactive ion beams

A. VantommeCorresponding Author Contact Information <#m4.cor*>, E-mail
The Corresponding Author <mailto:andre.vantomme@fys.kuleuven.ac.be>, B.
Degroote, S. Degroote, K. Vanormelingen, J. Meersschaut, B.
Croonenborghs, S. M. Van Eek, H. Pattyn, M. Rots and G. Langouche

Instituut voor Kern- en Stralingsfysica, Katholieke Universiteit Leuven,
Celestijnenlaan 200 D, B-3001 Leuven, Belgium

Available online 4 January 2002.


    Abstract

A variety of nuclear techniques rely on the incorporation of radioactive
atoms to investigate the microscopic structural, electronic and magnetic
properties of a material. In the past, ion implantation has been
utilized to introduce these radioactive probes, resulting in a depth
distribution of typically several hundreds of Å, and damaging the
sample. Both implantation-related deficiencies are incompatible with the
ever shrinking sizes relevant in nanostructures. This problem can be
circumvented by using ultra-low energy ion beams ¯ of the order of 5 eV,
i.e. below the displacement energy of the substrate atoms. Consequently,
the radioactive probes are "deposited" on top of the sample, without
generating damage to the substrate. Since the implantation chamber is in
vacuo connected with the molecular beam epitaxy deposition chamber, the
probe layer can be introduced at any stage during the sample growth
(from surface to interface) ¯ with monolayer depth resolution. As an
example, we discuss the ultra-low energy ion deposition of 111In in Cr,
followed by analysis with perturbed angular correlation spectroscopy.
The aim of the study is to explore the magnetic ordering of Cr thin films.

Author Keywords: Low energy ion deposition; Nuclear solid state physics;
Soft landing; Nanotechnology; Cr spin density wave

PACS classification codes: 75.70.Ak; 68.35.-p; 31.30.G; 61.18.F


    Article Outline

1. Introduction
2. LEID: the technique and the setup
3. Low energy ion deposition of In on Cr

3.1. Deposition of stable 115In ions
3.2. Deposition of radioactive 111In ions
3.3. Perturbed angular correlation experiment

4. Conclusion
Acknowledgements
References



Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TJN-44V1Y26-4&_image=fig1&_ba=1&_user=875668&_coverDate=05%2F31%2F2002&_rdoc=168&_fmt=summary&_orig=browse&_srch=%23toc%235315%232002%23998099998%23308017!&_cdi=5315&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=c4759f76df4dea95cd83087bc1a8c3ce>
(5K)
Fig. 1. Schematic diagram of the LEID set-up. The deposition energy is
selected by adjusting the output voltage of the power supply V2.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TJN-44V1Y26-4&_image=fig2&_ba=2&_user=875668&_coverDate=05%2F31%2F2002&_rdoc=168&_fmt=summary&_orig=browse&_srch=%23toc%235315%232002%23998099998%23308017!&_cdi=5315&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=b49a06496b44efecb07c31e1d25407d0>
(3K)
Fig. 2. Ion current through the grid as a function of output voltage V2.
The zero-point energy is set at approximately 50 V using power supply V1.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TJN-44V1Y26-4&_image=fig3&_ba=3&_user=875668&_coverDate=05%2F31%2F2002&_rdoc=168&_fmt=summary&_orig=browse&_srch=%23toc%235315%232002%23998099998%23308017!&_cdi=5315&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=ab619ecc126ddc74b6472dfb8d4429b4>
(10K)
Fig. 3. Schematic configuration of a transversal SDW with its wave
vector in the plane (a,c) or out of the plane (b,d) of the Cr layer. The
confinement of the radioactive probes in case of soft landing (c,d)
results in monolayer depth sensitivity, which cannot be obtained when
using conventional ion implantation (a,b).

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TJN-44V1Y26-4&_image=fig4&_ba=4&_user=875668&_coverDate=05%2F31%2F2002&_rdoc=168&_fmt=summary&_orig=browse&_srch=%23toc%235315%232002%23998099998%23308017!&_cdi=5315&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=ccd1d9a2d7af043e2948df2cc8619404>
(10K)
Fig. 4. PAC time spectrum of a 200 Å thick Cr layer, which was halfway
decorated with 111In probes, using ion beam deposition at 5 eV. The
solid line is a fit assuming a longitudinal SDW.


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