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doi:10.1016/S0040-6090(02)00247-X
<http://dx.doi.org/10.1016/S0040-6090(02)00247-X>    How to cite or link
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Copyright © 2002 Elsevier Science B.V. All rights reserved.


    Correlation between structural and magnetic properties of thin
    FexCo1-x(1 1 0) films on sapphire

J. SwertsCorresponding Author Contact Information <#m4.cor*>, E-mail The
Corresponding Author <mailto:johan.swerts@fys.kuleuven.ac.be>, K. Temst,
N. Vandamme, B. Opperdoes, C. Van Haesendonck and Y. Bruynseraede

Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke
Universiteit Leuven, Celestijnenlaan 200 D, B-3001, Leuven, Belgium

Received 16 July 2001;  revised 26 January 2002;  accepted 28 February
2002.  Available online 30 April 2002.


    Abstract

Fe and Fe40Co60 thin films (5?60 nm) with a bcc structure have been
prepared on a-axis oriented sapphire substrates by molecular beam
epitaxy. The structural properties have been characterized in situ by
reflection high-energy electron diffraction and ex situ by X-ray
diffraction and atomic force microscopy. A two-dimensional
magneto-optical Kerr effect set-up has been used to determine the
in-plane magnetization components and to investigate the magnetic
anisotropy and the orientation dependence of the magnetization reversal
process. The Fe films and Fe40Co60 alloy films both display a uniaxial
in-plane anisotropy. They also exhibit a comparable increase of the
coercive field along the easy axis with increasing thickness. We have
evaluated this dependence using the results of the structural
characterization, indicating that the enhancement of the coercive field
is linked to the growing surface roughness and decreasing structural
coherence.

Author Keywords: Fe; FeCo alloys; Structural properties; Magnetic
properties and measurements; Anisotropy


    Article Outline

1. Introduction
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec1>
2. Experimental details
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec2>
3. Structural characterization
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec3>

3.1. X-ray diffraction
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec4>
3.2. Atomic force microscopy
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec5>

4. Magnetic characterization
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec6>

4.1. Magnetic anisotropy
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec7>
4.2. Magnetization reversal
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec8>

5. Discussion
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec9>
6. Conclusions
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#sec10>
Acknowledgements
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References
<http://193.225.13.151/science?_ob=ArticleURL&_udi=B6TW0-45PTTR6-H&_user=875668&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_fmt=full&_coverDate=06%2F24%2F2002&_rdoc=30&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&_artOutline=Y&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=318f26dbb2cf65590d4a2e4acd5c4769#bibl1>




Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig1&_ba=1&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=fb163488bee9d984803058f2031f7464>
(10K)
Fig. 1. XRD profiles for the Fe (upper curve) and Fe40Co60 (lower curve)
films at (a) low angles and (b) high angles. The curves have been offset
vertically for clarity.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig2&_ba=2&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=5696eb460a338ae38d019d06e0d9eecf>
(9K)
Fig. 2. (a) Lattice constant for Fe and Fe40Co60 films vs. film
thickness; (b) Perpendicular coherence length vs. film thickness for Fe
and Fe40Co60 films.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig3&_ba=3&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=6af7a1fe79b2533726da103dd6efa42e>
(16K)
Fig. 3. (a) AFM micrograph of the surface of a 5 nm Fe40Co60 film for an
area of 500 nm by 500 nm. The black to white contrast is 3 nm; (b)
evolution of the rms roughness as a function of sample thickness derived
from the AFM measurements on the Fe40Co60 alloys on various length scales.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig4&_ba=4&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=d667cfad99aba74d92e5bffec0bd5db1>
(15K)
Fig. 4. Polar plot of the normalized in-plane remanent magnetization
MR/MS for a 60 nm Fe thin film (&z.cirf;) and a 53 nm Fe40Co60 thin film
(circle, open).

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig5&_ba=5&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=3a1a99881b94d3ba3d9c4acd9e20f8a6>
(13K)
Fig. 5. Measurements of the in-plane transverse component of the
magnetization of a 39 nm Fe film; (a) with the applied field along the
easy axis; (b) perpendicular to the easy axis; and (c) 30° away from the
easy axis. The insets of the graphs show the corresponding measurements
of the parallel magnetization component.

Enlarge Image
</science?_ob=MiamiCaptionURL&_method=retrieve&_udi=B6TW0-45PTTR6-H&_image=fig6&_ba=6&_user=875668&_coverDate=06%2F24%2F2002&_handle=W-WA-A-A-BE-MsSAYWA-UUA-AUZCEBCZDY-BVEAVEBV-BE-U&_rdoc=30&_fmt=summary&_orig=browse&_srch=%23toc%235548%232002%23995869998%23324684!&_cdi=5548&view=c&_acct=C000046981&_version=1&_urlVersion=0&_userid=875668&md5=373edb280ef8f7141068a88a04a7297d>
(5K)
Fig. 6. Coercive field vs. sample thickness with the magnetic field
applied along the easy axis. Fe films (&z.cirf;) and Fe40Co60 films
(circle, open). The dotted line is a guide for the eye.


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21. N. Metoki, Th. Zeidler, A. Stierle, K. Bröhl and H. Zabel J. Magn.
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