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      Applied Physics Letters -- October 28, 2002 -- Volume 81, Issue
      18, pp. 3425-3427


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      Antiferromagnetic hysteresis in magnetoresistive multilayers
      investigated by x-ray resonant scattering

    Carlo Spezzani, Piero Torelli, and Maurizio Sacchi Laboratoire pour
    l'Utilisation du Rayonnement Electromagnétique, (UMR 130), Centre
Universitaire Paris-Sud, B.P. 34, F-91898 Orsay, France

    Renaud Delaunay and Coryn F. Hague Laboratoire de Chimie
    Physique?Matière et Rayonnement (UMR 7614), Université Pierre et
Marie Curie, F-75231 Paris Cedex 05, France

    Vincent Cros and Frédéric Petroff Unité Mixte de Physique
    CNRS/THALES, Domaine de Corbeville, F-91404 Orsay
Université Paris Sud, F-91405 Orsay, France

(Received 6 March 2002; accepted 4 September 2002)

We have used resonant scattering of polarized soft x rays as a direct
probe of the magnetic order in a weakly coupled Co/Cu multilayer. Our
field dependent results, combined with in situ resistance measurements,
show a direct correlation between magnetoresistance and antiparallel
magnetic ordering in reversible and irreversible processes. ©2002
American Institute of Physics.


doi: <http://ojps.aip.org/jhtml/doi.jsp>10.1063/1.1517403
PACS: 75.70.Pa, 75.70.Cn, 75.50.Ee, 78.70.Ck        Additional
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        References

Citation links <http://ojps.aip.org/jhtml/refinfo/refinfo.html#cite>
[e.g., Phys. Rev. D 40, 2172 (1989)] go to online journal abstracts.
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