(Received 14 August 2001; published 3 December 2001)
We have performed an extensive comparative study of growth, structure, magnetization, and magnetotransport in Fe/Cr superlattices. A simple analysis of the experimental data shows that the giant magnetoresistance originates from interfacial scattering in the Fe/Cr system. The saturation resistivity is determined by the roughness lateral correlation length whereas the giant magnetoresistance is determined by the interface width.
©2001 The American Physical Society
URL: http://link.aps.org/abstract/PRB/v65/e012412
DOI: 10.1103/PhysRevB.65.012412
PACS:
75.70.Cn, 75.70.Pa
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-
P. M. Levy, Solid State Phys. 47, 367 (1994), and references therein.
-
M. A. M. Gijs and G. E. W. Bauer, Adv. Phys. 46, 285 (1997), and references therein. [INSPEC]
-
A. Barthelemy, A. Fert, and F. Petroff, in Handbook of Magnetism, edited by K. H. J. Buschow (Elsevier, New York, 1999), Vol. 12, and references therein.
-
W. P. Pratt Jr., S.-F. Lee, J. M. Slaughter, R. Loloee, P. A. Schroeder, and J. Bass, Phys. Rev. Lett. 66, 3060 (1991).
-
M. A. M. Gijs, S. K. J. Lenczowski, and J. B. Giesbers, Phys. Rev. Lett. 70, 3343 (1993).
-
M. A. M. Gijs, M. T. Johnson, A. Reinders, P. E. Huisman, R. J. M. van de Veerdonk, S. K. J. Lenczowski, and R. M. J. van Gansewinkel, Appl. Phys. Lett. 66, 1839 (1995).
-
T. Ono and T. Shinjo, J. Phys. Soc. Jpn. 64, 363 (1995). [INSPEC]
-
L. Piraux, J. M. George, J. F. Despres, C. Leroy, E. Ferain, R. Legras, K. Ounadjela, and A. Fert, Appl. Phys. Lett. 65, 2484 (1994).
-
A. Blondel, J. P. Meier, B. Doudin, and J. Ph. Ansermet, Appl. Phys. Lett. 65, 3019 (1994).
-
K. Liu, K. Nagodawithana, P. C. Searson, and C. L. Chien, Phys. Rev. B 51, 7381 (1995).
-
J.-G. Zhu, Y. Zheng, and G. A. Prinz, J. Appl. Phys. 87, 6668 (2000).
-
E. E. Fullerton, D. M. Kelly, J. Guimpel, I. K. Schuller, and Y. Bruynseraede, Phys. Rev. Lett. 68, 859 (1992).
-
J. M. Colino, I. K. Schuller, V. Korenivski, and K. V. Rao, Phys. Rev. B 54, 13 030 (1996).
-
M. Velez and I. K. Schuller, J. Magn. Magn. Mater. 184, 275 (1998) (ScienceDirect).
-
J. E. Mattson, M. E. Brubaker, C. H. Sowers, M. Conover, Z. Qiu, and S. D. Bader, Phys. Rev. B 44, 9378 (1991);
Z. Q. Qiu, J. E. Mattson, C. H. Sowers, U. Welp, S. D. Bader, H. Tang, and J. C. Walker, ibid. 45, 2252 (1992).
-
S. S. P. Parkin, Phys. Rev. Lett. 71, 1641 (1993).
-
M. C. Cyrille, S. Kim, M. E. Gomez, J. Santamaria, K. M. Krishnan, and I. K. Schuller, Phys. Rev. B 62, 3361 (2000).
-
M. C. Cyrille, S. Kim, M. E. Gomez, J. Santamaria, C. Leighton, K. M. Krishnan, and I. K. Schuller, Phys. Rev. B 62, 15 079 (2000).
-
I. K. Schuller, Phys. Rev. Lett. 44, 1597 (1980);
W. Sevenhans, M. Gijs, Y. Bruynseraede, H. Homma, and I. K. Schuller, Phys. Rev. B 34, 5955 (1986);
E. E. Fullerton, I. K. Schuller, H. Vanderstraeten, and Y. Bruynseraede, ibid. 45, 9292 (1992);
D. M. Kelly, E. E. Fullerton, J. Santamaria, and I. K. Schuller, Scr. Metall. Mater. 33, 1603 (1995) (ScienceDirect). [INSPEC]
-
A. L. Barabasi and H. E. Stanley, in Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
-
R. Schad, P. Belien, G. Verbanck, C. D. Potter, H. Fischer, S. Lefebvre, M. Bessiere, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. B 57, 13 692 (1998).
-
R. Schad, P. Belien, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, H. E. Fischer, S. Lefebvre, and M. Bessiere, Phys. Rev. B 59, 1242 (1999).
-
J. Bass and W. P. Pratt, Jr., J. Magn. Magn. Mater. 200, 274 (1999) (ScienceDirect); [INSPEC]
J. A. Borchers, J. A. Dura, J. Unguris, D. Tulchinsky, M. H. Kelley, C. F. Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt, Jr., and J. Bass, Phys. Rev. Lett. 82, 2796 (1999).
-
P. M. Levy (private communication).
-
P. Weinberger, J. Phys.: Condens. Matter 8, 7677 (1996); [INSPEC]
A. M. Llois and M. Weissman (private communication);
P. Zahn et al., Phys. Rev. Lett. 80, 4309 (1998);
ibid. 75, 2996 (1995).
-
J. W. Cable, M. R. Khan, G. P. Felcher, and I. K. Schuller, Phys. Rev. B 34, 1643 (1986).
-
M. J. Pechan, J. M. Ancher, D. M. Kelly, C. F. Majkrzak, and I. K. Schuller, J. Appl. Phys. 75, 6178 (1994).
-
J. F. Mac Kay, C. Teichert, D. E. Savage, and M. G. Lagally, Phys. Rev. Lett. 77, 3925 (1996).
-
E. E. Fullerton, J. Pearson, C. H. Sowers, S. D. Bader, X. Z. Wu, and S. K. Sinha, Phys. Rev. B 48, 17432 (1993).
-
W. H. Butler, X. G. Zhang, D. M. C. Nicholson, T. C. Schulthess, and J. M. MacLaren, Phys. Rev. Lett. 76, 3216 (1996);
I. Mertig, J. Appl. Phys. 79, 5276 (1996).
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