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Hyperfine Interactions
144 (1): 45-52, 2002
Copyright © 2002 Kluwer Academic Publishers
All rights reserved


    Recent Developments in Synchrotron Mössbauer Reflectometry

L. Deák
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

L. Bottyán
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

M. Major
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

D. L. Nagy
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

H. Spiering
Institute für Anorganische und Analytische Chemie, Johannes Gutenberg
Universität, Mainz, Germany

E. Szilágyi
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

F. Tanczikó
KFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

Abstract

Synchrotron Mössbauer Reflectometry (SMR), the grazing incidence nuclear
resonant scattering of synchrotron radiation, can be applied to perform
depth-selective phase analysis and to determine the isotopic and
magnetic structure of thin films and multilayers. Principles and
methodological aspects of SMR are briefly reviewed. Off-specular SMR
provides information from the lateral structure of multilayers. In
anti-ferromagneticly coupled systems the size of magnetic domains can be
measured.

Keywords
Mössbauer reflectometry, magnetic multilayers, off-specular scattering,
antiferromagnetic domains, anisotropic optics

Article ID: 5121382