Applied Physics Letters
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Applied Physics Letters -- August 19, 2002 -- Volume 81, Issue 8, pp. 1465-1467


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Crystallographic orientation of Cr in longitudinal recording media and its relation to magnetic anisotropy

Antony Ajan and Iwao Okamoto
Advanced Magnetic Recording Laboratory, Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243 0197, Japan

(Received 9 April 2002; accepted 18 June 2002)

A specific growth of Cr layer grains is found to exist when grown on the mechanically textured NiP–Al substrates used for longitudinal recording. High resolution transmission electron microscopy analysis of a large number of individual Cr grains indicate a Cr[110] preferential growth along the textured direction (groove or circumferential direction). This particular orientation of the Cr underlayer is found to be the cause of an in-plane magnetic anisotropy of the Co based magnetic layer. The temperature dependence of this in-plane magnetic anisotropy study indicated the importance of the specific crystallographic orientations of both the underlayer and the magnetic layer. ©2002 American Institute of Physics.


doi:10.1063/1.1500433
PACS: 75.70.Ak, 75.30.Gw, 75.50.Ss, 68.37.Lp        Additional Information

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References

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