Skip Main Navigation Links ScienceDirect Logo Skip Main Navigation Links Register or Login: Password: Home Browse Search Forms My Alerts My Profile Help (Opens new window) Quick Search: within Quick Search searches abstracts, titles, and keywords. Click for more information. 6 of 14 Result List Previous Next Vacuum Volume 60, Issue 4 , March 2001, Pages 401-405 This Document SummaryPlus Full Text + Links PDF (133 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation PII: S0042-207X(00)00224-4 Copyright © 2001 Elsevier Science Ltd. All rights reserved. Effect of interface structure correlation on magnetoresistance of Fe/Cr multilayers Amitesh PaulCorresponding Author Contact Information <#m4.cor*>, E-mail The Corresponding Author , Ajay Gupta, S. M. Chaudhari and D. M. Phase Inter-University Consortium for DAE Facilities, University Campus, Khandwa Road, Indore-452017, India Received 12 January 2000; revised 29 March 2000. Available online 1 February 2001. Abstract Effect of interfacial roughness on giant magnetoresistance (GMR) in Fe/Cr multilayers has been studied. A set of samples is prepared by simultaneously depositing on a set of float-glass (FG) substrates with varying rms surface roughness. This causes the correlated part of the rms roughness to vary from sample to sample. Another set of specimen is irradiated with 200 MeV Ag ions in order to induce uncorrelated roughness at the interfaces. In both the cases morphological and other microstructural features of different multilayers remained similar, thus allowing one to separate the effect of interface roughness from that of morphological changes. GMR measurements on these multilayers show that increasing interfacial roughness causes GMR to decrease nonlinearly. It is found that the effect of uncorrelated part of the roughness is much stronger than that of the correlated part. Author Keywords: Magnetic films and multilayers; Giant magnetoresistance; Interface structure and roughness Article Outline 1. Introduction 2. Experimental 3. Results 4. Discussions 5. Conclusions References Enlarge Image (8K) Fig. 1. X-ray reflectivity scans of Fe/Cr multilayers on float glass (FG) substrates with different etching times and on microscopic glass slide (SG). For clarity, various curves are shifted relative to each other along the y-axis. Enlarge Image (3K) Fig. 2. Variation of percentage GMR with surface roughness of the substrates. Enlarge Image (6K) Fig. 3. XRR scans of [Fe(3.0 nm)/Cr(1.2 nm)]×20 multilayers showing irradiated spectra with different irradiation fluences of (a) 2×1011 (b) 5×1011 (c) 1×1012 (d) 5×1012 (e) 1.5×1013 and (f) 3×1013 ions/cm2 irradiated with 200 MeV Ag ion. Enlarge Image (5K) Fig. 4. GMR of the as-deposited and irradiated specimens of [Fe(3.0 nm)/Cr(1.2 nm)]×20 multilayers deposited on float glass (- - -blacksquare sq bullet, filled- - -) and Si substrate (0) as a function of fluence irradiated with 200 MeV Ag ions. Table 1. Microstructural parameters of Fe/Cr multilayers on float glass (FG) substrates with different etching times T. small sigma, Greek is the rms roughness of the glass substrates after etching for different periods of time. The values of the lattice spacing d of (1 1 0) planes, structural coherence length small xi, Greek, and average grain size in x¯y plane t is also reported. The relative area A under the broad hyperfine field component in the CEMS gives the fraction of total iron atoms located at the interfaces and is a measure of the thickness of the intermixed layer. The last column gives the saturation magnetoresistance of the multilayer View Table (<1K) References 1. E.E. Fullerton, D.M. Kelly, J. Guimpel, I.K. Schuller and Y. Bruynserade. Phys Rev Lett 68 (1992), p. 859. Abstract-INSPEC | $Order Document | Full Text via CrossRef 2. J. Barnas and Y. Bruynserade. Phys Rev B 53 (1996), p. 5449. Abstract-INSPEC | $Order Document | Full Text via CrossRef 3. H. Nakashini, A. Okiji and H. Kasai. J Magn Magn Mater 126 (1993), p. 451. 4. F. Petroff, A. Barthelemy, A. Hamzic, A. Fert, P. Etienne, S. Lequien and G. Cruzet. J Magn Magn Mater 93 (1991), p. 95. Abstract-Compendex | Abstract-INSPEC | $Order Document 5. K. Takanashi, Y. Obi, Y. Mitani and H. Fujimore. J Phys Soc Japan 61 (1992), p. 1169. Abstract-INSPEC | $Order Document 6. N.M. Rensing, A.P. Payne and B.M. Clemens. J Magn Magn Mater 121 (1993), p. 436. Abstract-INSPEC | $Order Document 7. P. Beliën, R. Schad, C.D. Potter, G. Verbanck, V.V. Moshchalkov and Y. Bruynserade. Phys Rev B 50 (1994), p. 9957. Abstract-INSPEC | $Order Document 8. D.M. Kelly, I. Schuller, V. Koreniviski, K.V. Rao, K.K. Larsen, J. Bottiger, E.M. Gyorgy and R.B. Van Dover. Phys Rev B 50 (1994), p. 3481. Abstract-INSPEC | $Order Document | Full Text via CrossRef 9. L.H. Laider, B.J. Hickey, T.R.A. Hickey, T.R.A. Hase, B.K. Tanner, R. Schad and Y. Bruynserade. J Magn Magn Mater 156 (1996), p. 332. 10. R. Schad, P. Beliën, G. Verbanck, C.D. Potter, H. Fisher, S. Lefebvre, M. Bessiere, V.V. Moshchalkov and Y. Bruynseraede. Phys Rev B 57 (1998), p. 13692. Abstract-INSPEC | $Order Document | APS full text | Full Text via CrossRef 11. M. Velez and I. Schuller. J Magn Magn Mater 184 (1998), p. 275. Abstract | PDF (408 K) 12. J.C. Slonczewiski. Phys Rev Lett 67 (1991), p. 3172. 13. A. Schreyer, J.F. Ankner, Th. Zeidler, H. Zabel, M. Schäfer, J.A. Wolf, P. Grünberg and C.F. Majkrzak. Phys Rev B 52 (1995), p. 16066. Abstract-INSPEC | $Order Document | Full Text via CrossRef 14. S.S.P. Parkin and B.R. York. Appl Phys Lett 62 (1993), p. 1842. Abstract-INSPEC | $Order Document | Full Text via CrossRef 15. E.E. Fullerton, M.J. Conover, J.E. Mattson, C.H. Sowers and S.D. Bader. Phys Rev B 48 (1993), p. 15755. Abstract-INSPEC | $Order Document | Full Text via CrossRef 16. J.M. Colino, I.K. Schuller, R. Schad, C.D. Potter, P. Beliën, G. Verbanck, V.V. Moshchalokov and Y. Bruynserade. Phys Rev B 53 (1996), p. 766. Abstract-INSPEC | $Order Document | Full Text via CrossRef 17. A. Gupta, A. Paul, R. Gupta, D.K. Avasthi and G. Principi. J Phys Condens Mater 10 (1998), p. 9669. Abstract-INSPEC | $Order Document | Full Text via CrossRef Corresponding Author Contact Information <#m4.bcor*> Corresponding author. Tel.: +91-0731-463913; fax: +91-0731-462294; email: prasanna@iucindore.ernet.in This Document SummaryPlus Full Text + Links PDF (133 K) ------------------------------------------------------------------------ Actions Cited By Save as Citation Alert Export Citation Vacuum Volume 60, Issue 4 , March 2001, Pages 401-405 6 of 14 Result List Previous Next Home Browse Search Forms My Alerts My Profile Help (Opens new window) ScienceDirect Logo Send feedback to ScienceDirect Software and compilation © 2002 ScienceDirect. All rights reserved. ScienceDirect® is an Elsevier Science B.V. registered trademark. Your use of this service is governed by Terms and Conditions . Please review our Privacy Policy for details on how we protect information that you supply.