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Applied Surface Science

Volume 182, Issues 3-4
22 October 2001
Pages 209-215

DOI: 10.1016/S0169-4332(01)00413-5
PII: S0169-4332(01)00413-5

Copyright © 2001 Published by Elsevier Science B.V. All rights reserved.

Perspectives of polarized-neutron reflectometry: magnetic domains and off-specular scattering

G. P. Felcher, and S. G. E. te Velthuis

Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA

Available online 3 January 2002.

Abstract

Specular reflectometry of polarized-neutrons was developed in the 1980s as a tool for measuring magnetic depth profiles in flat films, which were laterally uniform. When the lateral uniformity breaks down in an assembly of domains, off-specular grazing incidence scattering takes place. This review discusses this new frontier of reflectometry, describing the advances that are taking place in linking the observations of the scattering at grazing incidence with the size, the statistics, and the magnetic orientation of the domains. The article discusses also the progress made in linking the domain distribution thus found with the transport properties of these nanomagnetic systems.

Author Keywords: Polarized-neutron reflectivity; Off-specular scattering; Magnetic thin films; Multilayers; Domains

Article Outline

1. The image of antiferromagnetic domains
2. Antiferromagnetic domains: the Born approximation
3. Evolution of the methods of analysis
4. Domain size and transport properties
Acknowledgements
References


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Fig. 1. Geometry of scattering at grazing incidence: specular reflection (i=f), scattering in the specular plane (=0) and off the specular plane.

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Fig. 2. An AF superlattice of Fe/Cr, and its breakdown into AF domains.

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Fig. 3. Off-specular scattering from an AF Fe/Cr multilayer: the contours are plotted vs. neutron wavelength and angle of scattering. Sizeable scattering occurs around the AF (1/2) peak [3].

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Fig. 4. Contour plot of an AF Fe/Cr multilayer, as a function of the angles of incidence in (=i) and scattering final (=f). The large peaks on the diagonal are AF [4].

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Fig. 5. Contour plot of an AF Fe/Cr multilayer, as a function of qx, qz. The strong innermost peak along the line qx=0 is AF; the outer weak one is structural [5].

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Fig. 6. The diffuse scattering observed at the AF peak of a Co/Cu multilayer as a function of applied field. The lines are fits to the data [9].

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Fig. 7. Field dependence of the magnetization, the magnetoresistance and the domain fitting parameter for a Co/Cu multilayer [9].

References

1. J.F. Ankner and G.P. Felcher. J. Magn. Magn. Mater. 200 (1999), p. 741. SummaryPlus | Article | Journal Format-PDF (739 K)

2. A. Bland, B Heinrich, Ultrathin Magnetic Structures, Springer, Berlin, 1994.

3. M. Takeda, Y. Endoh, A. Kamijo and J. Mizuki. Phys. B 248 (1998), p. 14. Abstract | Journal Format-PDF (520 K)

4. V. Lauter-Pasyuk, H.J. Lauter, B. Toperverg, O. Nikonov, E. Kravtsov, M.A. Milyaev, R. Romashev and V. Ustinov. Phys. B 283 (2000), p. 194. SummaryPlus | Article | Journal Format-PDF (434 K)

5. W. Hahn, M. Loewenhaupt, G.P. Felcher, Y.Y. Huang and S.S.P. Parkin. J. Appl. Phys. 75 (1994), p. 3564. Abstract-INSPEC |  $Order Document | Full-text via CrossRef

6. D.E. Savage, J. Kleiner, N. Schimke, Y.H. Phang, T. Jankowski, J. Jacobs, R. Kariotis and M.G. Lagally. J. Appl. Phys. 69 (1991), p. 1411. Abstract-INSPEC |  $Order Document | Full-text via CrossRef

7. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley. Phys. Rev. B 38 (1988), p. 2297. Abstract-INSPEC |  $Order Document | Full-text via CrossRef

8. Y.Y. Huang, G.P. Felcher and S.S.P. Parkin. J. Magn. Magn. Mater. 99 (1991), p. L31. Abstract-INSPEC | Abstract-Compendex |  $Order Document

9. S. Langridge, J. Schmalian, C.H. Marrows, D.T. Dekadjevi and B.J. Hickey. Phys. Rev. Lett. 85 (2000), p. 4964. Abstract-INSPEC |  $Order Document | Full-text via CrossRef

10. A. Rühm, B.P. Toperverg and H. Dosch. Phys. Rev. B 60 (1999), p. 16073. Abstract-INSPEC |  $Order Document | APS full text

11. B. Nickel, A. Rühm, W. Donner, J. Major, H. Dosch, A. Schreyer, H. Zabel and H. Humblot. RSI 72 (2001), p. 163. Abstract-INSPEC |  $Order Document | Full-text via CrossRef

12. N. Hosoito, K. Mibu, S. Araki, T. Shinjo, S. Itoh and Y. Endoh. J. Phys. Soc. Jpn. 61 (1992), p. 300. Abstract-INSPEC |  $Order Document

13. M. Takeda, Y. Endoh, H. Yasuda, K. Yamada, A. Kamijo and J. Mizuki. J. Phys. Soc. Jpn. 62 (1993), p. 3015. Abstract-INSPEC |  $Order Document

14. J.A. Borchers, P.M. Gehring, R.W. Erwin, J.F. Ankner, C.F. Majkrzak, T.L. Hylton, K.R. Coffey, M.A. Parker and J.K. Howard. Phys. Rev. B 54 (1996), p. 9870. Full-text via CrossRef

15. J.A. Borchers, J.A. Dura, J. Unguris, D. Tulchinsky, M.H. Kelley, C.F. Majkrzak, S.Y. Hsu, R. Loloee, W.P. Pratt, Jr. and J. Bass. Phys. Rev. Lett. 82 (1999), p. 2796. Abstract-INSPEC |  $Order Document | APS full text | Full-text via CrossRef

16. D.L. Nagy, L. Bottyán, B. Croonenborghs, L. Deák, B. Degroote, J. Dekoster, H.J. Lauter, V. Lauter-Pasyuk, O. Leupold, M. Major, J. Meersschaut, O. Nikonov, A. Petrenko, R. Rüffer, H. Spiering, E. Szilágyi, in press.

17. S.V. Maleyev, B.P. Toperverg (Eds.), in: Proceedings of the 3rd International Workshop on Polarized Neutrons for Condensed Matter Investigations, Gatchina, 20 June 2000, Phys. B 297 (1¯4) (2001).

Corresponding author. Tel.: +1-630-252-5516; fax: +1-630-252-7777; email: felcher@anl.gov
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Applied Surface Science
Volume 182, Issues 3-4
22 October 2001
Pages 209-215


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