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doi:10.1016/S0304-8853(00)00771-X
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Copyright © 2001 Elsevier Science B.V. All rights reserved.


    Electron interaction with domain walls in Fe/Cr multilayers at low
    temperatures

F. G. AlievCorresponding Author Contact Information <#m4.cor*>, E-mail
The Corresponding Author <mailto:Farkhad.Aliev@uam.es>, a <#aff1>, R.
Schadb <#aff2>, A. Volodinc <#aff3>, C. van Haesendonckc <#aff3>, Y.
Bruynseraedec <#aff3> and R. Villara <#aff1>

a Dpto. de Fisica de la Materia Condensada, Instituto Ciencia de
Materiales "Nicolas Cabrera", C -III, Universidad Autonoma de Madrid,
28049 Madrid, Spain
b Center for Materials for Information Technology, University of
Alabama, Tuscaloosa, AL 35487, USA
c Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke
Universiteit Leuven, B3001 Leuven, Belgium

Available online 2 November 2001.


    Abstract

For antiferromagnetically coupled [Fe/Cr]10 multilayers with Fe(Cr)
thickness 30(13.5) Å and 12(12) Å, we found that at low fields the
contribution of the domain walls to the resistivity, small rho, GreekDW,
is small at room temperature and strongly enhanced at low temperatures.
Magnetic force microscopy images clearly reveal the presence of domain
walls. In a wide interval above 1.9 K small rho, GreekDW varies as small
rho, GreekDW(T)=small rho, GreekDW(0)−ATsmall alpha, Greek with the
exponent small alpha, Greeksimilar, equals0.7–1, indicating the possible
presence of quantum interference effects in the quasiballistic electron
transport through domain walls.

Author Keywords: Domain wall; Magnetoresistance—multilayers; Magnetic
imaging


    Article Outline

• References
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(15K)
Fig. 1. Upper inset shows magnetic force microscopy images of
[Fe(30 Å)/Cr(13.5 Å)]10 MML taken over the (16×16) small mu, Greekm2
area before and after applying an external magnetic field. The main part
of the figure shows the temperature dependence of the resistivity in
different magnetic fields. In the left lower inset we have plotted
Δsmall rho, GreekDW/nDW(H) as a function of T0.7 for various magnetic
fields (here nDW(H) is a parameter which roughly reflects the DW
concentration). In the right lower inset we have plotted variation of
resistivity small rho, Greek(T,H)−small rho, Greek(T, 4 K) down to 50 mK.


    References

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Corresponding Author Contact Information <#m4.bcor*> Corresponding
author. Tel.: +34-91-3974756; fax: +34-91-3973961; email:
Farkhad.Aliev@uam.es <mailto:Farkhad.Aliev@uam.es>



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, May 2001, Pages 745-746



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