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PII: S0921-4526(99)01469-6
Copyright © 2000 Elsevier Science B.V. All rights reserved.
Neutron reflectometry on magnetic thin films
Hartmut Zabel, , a, Ralf Siebrechtb and Andreas Schreyer
a Institut für Festkörperphysik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
b Institute Laue-Langevin, F-38042 Grenoble Cedex, France
Available online 2 May 2000.
The current interest in the magnetism of ultrathin films is driven by their manifold applications in the nano-technology area, for instance as magnetic field sensors or as devices for information storage. Neutron scattering has played a dominant role for the determination of spin structures, phase transitions, and magnetic excitations in bulk materials. Today, its potential for the investigation of thin magnetic films has to be redefined. In the field of thin film magnetism, polarized neutron reflectivity (PNR) at small wave vectors can provide precise information on magnetization vectors in the film plane and on their variation from plane to plane. Therefore, neutron scattering remains the only method which allows to unravel the magnetization in thin films and superlattices independent of their thickness and depth below the surface. In addition, PNR is not only sensitive to structural interface roughness but also to the magnetic roughness. Some new developments will be discussed.
Author Keywords: Reflectometry; Polarised neutrons; Thin films; Planar ferromagnets
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Corresponding author. Tel.: +49-234-700-3649; fax: +49-234-709-4173; email: hartmut.zabel@ruhr-uni-bochum.de
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