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      Phys. Rev. B 61, 80?83 (2000)


      [Issue 1 ? 1 January 2000 ]

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      Antiferromagnetic thickness dependence of exchange biasing

    Haiwen Xi and Robert M. White
    Data Storage Systems Center, Carnegie Mellon University, Pittsburgh,
    Pennsylvania 15213

Received 9 September 1999

A theory for a ferromagnetic/antiferromagnetic (FM/AF) exchange coupled
bilayer of finite thickness is presented. Calculations based on this
theory describe the reversible and irreversible transitions of the
magnetic moments in this FM/AF system. A description of the exchange
bias effect is offered that explains the observed phenomena of enhanced
coercivity and rotational hysteresis. The theory also explains the AF
thickness dependence of the exchange field and the coercivity.

©2000 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v61/p80
DOI: 10.1103/PhysRevB.61.80
PACS: 75.70.Cn, 75.30.Gw, 75.50.Ss, 75.60.Ej

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