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Physical Review B (Condensed Matter and Materials Physics) -- April 1, 2000 -- Volume 61, Issue 13 pp. 8966-8975

Resonant x-ray scattering studies of the magnetic structure near the surface of an antiferromagnet

G. M. Watson

Department of Physics, University of Maryland Baltimore County, Baltimore, Maryland 21250

Doon Gibbs

Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000

G. H. Lander

European Commission, Joint Research Center, Institute for Transuranium Elements, Postfach 2340, D-76125 Karlsruhe, Germany

B. D. Gaulin

Department of Physics and Astronomy, McMaster University, Hamilton, Ontario, Canada L8S 4M1

L. E. Berman

National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973-5000

Hj. Matzke

European Commission, Joint Research Center, Institute for Transuranium Elements, Postfach 2340, D-76125 Karlsruhe, Germany

W. Ellis

Los Alamos National Laboratory, Los Alamos, New Mexico 87545

(Received 18 October 1999)

Resonant x-ray magnetic scattering is used to study magnetic order near the (001) surface of the antiferromagnetic oxide UO₂ for temperatures between 10 and 35 K. It is found that for temperatures below the bulk Néel temperature a magnetically disordered region exists at the surface, and is separated from the magnetically ordered bulk by a diffuse magnetic interface. The width of the magnetic interface is temperature dependent, and appears to diverge as the sample temperature approaches the bulk Néel temperature. In contrast to the bulk, which exhibits a discontinuous magnetic ordering transition, the surface layers order continuously. These results are shown to be qualitatively consistent with the theory of surface induced disorder. ©2000 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v61/p8966
DOI: 10.1103/PhysRevB.61.8966
PACS: 75.50.Ee, 61.10.Kw, 75.30.Pd        Additional Information

References

1. G. A. Prinz, Nature (London) 250, 1092 (1990).
   
2. W. L. O'Brien and B. P. Tonner, Phys. Rev. B 52, 15 332 (1995).
   
3. See, for example, J. G. Tobin, K. W. Goodman, F. O. Schumann, R. F. Willis, J. B. Kortright, J. D. Denlinger, E. Rotenberg, A. Warwick, and N. V. Smith, Surf. Sci. 395, L227 (1998). [INSPEC] [ISI]
   
4. A notable exception to this is neutron reflectometry. See, for example, G. P. Felcher, R. T. Kampwirth, K. E. Grey, and R. Felici, Phys. Rev. Lett. 52, 1539 (1984). [SPIN] [ISI]
   
5. A. Fasolino, P. Carra, and M. Altarelli, Phys. Rev. B 47, 3877 (1993); [ISI]
   G. P. M. Poppe and A. Fasolino, Surf. Sci. 331, 1186 (1995). [INSPEC]
   
6. C.-C. Kao, J. B. Hastings, E. D. Johnson, D. P. Siddons, G. C. Smith, and G. A. Prinz, Phys. Rev. Lett. 65, 373 (1990). [ISI]
   
7. J. F. MacKay, C. Teichert, D. E. Savage, and M. G. Lagally, Phys. Rev. Lett. 77, 3925 (1996). [ISI]
   
8. J. M. Tonnerre, L. Sève, D. Raoux, G. Soullié, B. Rodmacq, and P. Wolfers, Phys. Rev. Lett. 75, 740 (1995). [ISI]
   
9. C.-C. Kao, C. T. Chen, E. D. Johnson, J. B. Hastings, H.-J. Lin, G. H. Ho, G. Meigs, J.-M. Brot, S. L. Hulbert, Y. U. Idzerda, and C. Vettier, Phys. Rev. B 50, 9599 (1994); [ISI]
   M. Sacchi, J. Vogel, and S. Iacobucci, J. Magn. Magn. Mater. 147, L11 (1995) (ScienceDirect); [INSPEC] [ISI]
   V. Chakarian, Y. U. Idzerda, C.-C. Kao, and C. T. Chen, 165, 52 (1997); [INSPEC]
   J. W. Freeland, V. Chakarian, Y. U. Idzerda, S. Doherty, J. G. Zhu, J.-H. Park, and C.-C. Kao, Appl. Phys. Lett. 71, 276 (1997); [ISI]
   M. Sacchi, C. F. Hague, E. M. Gullikson, and J. H. Underwood, Phys. Rev. B 57, 108 (1998). [ISI]
   
10. D. B. McWhan, C. Vettier, E. D. Isaacs, G. E. Ice, D. P. Siddons, J. B. Hastings, C. Peters, and O. Vogt, Phys. Rev. B 42, 6007 (1990). [ISI]
    
11. S. Ferrer, J. Alvarez, E. Lindgren, X. Torrelles, P. Fajardo, and F. Boscherini, Phys. Rev. B 56, 9848 (1997). [ISI]
    
12. S. F. Alvarado, M. Campagna, and H. Hopster, Phys. Rev. Lett. 48, 51 (1982). [SPIN] [ISI]
    
13. D. Weller, S. F. Alvarado, W. Gudat, K. Schroden, and M. Campagna, Phys. Rev. Lett. 54, 1555 (1985). [ISI]
    
14. R. Lipowsky, Phys. Rev. Lett. 49, 1575 (1982); [SPIN] [ISI]
    R. Lipowsky and W. Speth, Phys. Rev. B 28, 3983 (1983). [SPIN] [ISI]
    
15. R. Lipowsky, Ferroelectrics 73, 69 (1987). [INSPEC] [ISI]
    
16. W. Schweika, D. P. Landau, and K. Binder, Phys. Rev. B 53, 8937 (1996). [ISI]
    
17. H. Dosch, L. Mailander, H. Reichart, J. Peisl, and R. L. Johnson, Phys. Rev. B 43, 13 172 (1991). [ISI]
    
18. H. Reichert, P. J. Eng, H. Dosch, and I. K. Robinson, Phys. Rev. Lett. 74, 2006 (1995). [ISI]
    
19. G. M. Watson, D. Gibbs, G. H. Lander, B. D. Gaulin, L. E. Berman, Hj. Matzke, and W. Ellis, Physica B 221, 405 (1996) (ScienceDirect); [INSPEC] [ISI]
    Phys. Rev. Lett. 77, 751 (1996).
    
20. C. C. Tang, W. G. Stirling, G. H. Lander, D. Gibbs, W. Herzog, P. Carra, B. T. Thole, K. Mattenberger, and O. Vogt, Phys. Rev. B 46, 5287 (1992). [ISI]
    
21. D. Gibbs, G. Grübel, D. R. Harshman, E. D. Isaacs, D. B. McWhan, D. Mills, and C. Vettier, Phys. Rev. B 43, 5663 (1991). [ISI]
    
22. B. C. Frazer, G. Shirane, D. E. Cox, and C. E. Olsen, Phys. Rev. 140, A1448 (1965);
    B. T. M. Willis and R. I. Taylor, Phys. Rev. Lett. 17, 188 (1965). [ISI]
    
23. O. G. Brandt and C. T. Walker, Phys. Rev. 170, 528 (1968). [ISI]
    
24. J. Faber and G. H. Lander, Phys. Rev. B 14, 1151 (1976). [INSPEC] [ISI]
    
25. R. Feidenhans'l, Surf. Sci. Rep. 10, 105 (1989); [INSPEC] [ISI]
    I. K. Robinson and D. J. Tweet, Rep. Prog. Phys. 55, 599 (1992). [INSPEC] [ISI]
    
26. G. C. Allen, P. M. Tucker, and J. W. Tyler, Vacuum 32, 481 (1982). [INSPEC] [ISI]
    
27. T. N. Taylor and W. P. Ellis, Surf. Sci. 77, 321 (1978); [INSPEC] [ISI]
    107, 249 (1981). [INSPEC]
    
28. Hj. Matzke and A. Turos, J. Nucl. Mater. 114, 349 (1983); [ISI]
    Solid State Ionics 49, 189 (1991); [INSPEC]
    A. Turos, R. Falcone, A. Drigo, A. Sambo, L. Nowicki, N. Madi, J. Jagielski, and Hj. Matzke, Nucl. Instrum. Methods Phys. Res. B 118, 659 (1996). [INSPEC] [ISI]
    
29. D. Gibbs, B. M. Ocko, D. M. Zehner, and S. G. J. Mochrie, Phys. Rev. B 42, 7330 (1990). [ISI]
    
30. J. P. Hannon, G. T. Trammell, M. Blume, and D. Gibbs, Phys. Rev. Lett. 61, 1245 (1988). [ISI]
    
31. V. M. Matveev and V. V. Matveev, Physica B 208-209, 768 (1995). [INSPEC]
    
32. G. M. Watson, B. D. Gaulin, D. Gibbs, T. R. Thurston, P. J. Simpson, S. M. Shapiro, G. H. Lander, Hj. Matzke, S. Wang, and M. Dudley, Phys. Rev. B 53, 686 (1996). [ISI]
    
33. F. Stanglmeier, B. Lengeler, W. Weber, H. Gobel, and M. Schuster, Acta Crystallogr., Sect. A: Found. Crystallogr. A48, 626 (1992). [INSPEC] [ISI]
    
34. J. O. Cross, M. Newville, J. J. Rehr, L. B. Sorenson, C. E. Bouldin, G. M. Watson, T. Gouder, G. H. Lander, and M. I. Bell, Phys. Rev. B 58, 11 215 (1998). [ISI]
    
35. R. W. James, The Optical Principles of the Diffraction of X Rays (G. Bell and Sons, London, 1962).
    
36. J. M. Cowley, Phys. Rev. 77, 669 (1950); [ISI]
    J. Appl. Phys. 21, 24 (1950).
    
37. H. Dosch, L. Mailander, A. Lied, J. Peisl, F. Grey, R. L. Johnson, and S. Krummacher, Phys. Rev. Lett. 60, 2382 (1988); [ISI]
    H. Dosch and J. Peisl, Colloq. Phys. 50, C7-257 (1989).
    
38. A. Arrott and J. E. Goldman, Phys. Rev. 108, 948 (1957). [ISI]