[ Previous / Next Abstract | Issue Table of Contents | Bottom of Page ]

Physical Review B (Condensed Matter and Materials Physics) -- May 15, 2000 -- Volume 61, Issue 20, pp. 14108-14113

Infrared optical properties of ultrathin Fe films on MgO(001) beyond the percolation threshold

G. Fahsold, A. Bartel, O. Krauth, N. Magg, and A. Pucci

Universität Heidelberg, Kirchhoff-Institut für Physik, Albert-Ueberle-Str. 3-5, 69120 Heidelberg, Germany

(Received 25 October 1999)

In ultrathin metallic films the scattering and the spatial distribution of charge are influenced by the interfaces with the vacuum and with the substrate, and by the resulting confinement of electrons. To investigate the dynamic conductivity of the free charge carriers, as the main contribution to the ir dielectric function, we used in situ transmission spectroscopy in the middle ir, which we performed during the evaporation of Fe on MgO(001) in ultrahigh vacuum. Up to a thickness of about 3 nm we find ir absorption and spectral dispersion clearly different from bulk iron behavior. For continuous films such findings indicate significant scattering of charge carriers at the surface and, at closer inspection of sets of spectra, a thickness dependent effective ir optical oscillator strength. The type of thickness dependence of surface scattering and of oscillator strength is correlated to the development of mesoscopic roughness during growth. ©2000 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v61/p14108
DOI: 10.1103/PhysRevB.61.14108
PACS: 78.66.-w, 78.30.-j, 73.50.-h        Additional Information

References

1. J.E. Morris, Vacuum 50, 107 (1998) (ScienceDirect).
   
2. L.A. Kuzik, V.A. Yakovlev, F.A. Pudonin, and G. Mattei, Surf. Sci. 361/362, 882 (1996). [INSPEC]
   
3. M. Jalochowski and E. Bauer, Phys. Rev. B 38, 5272 (1988).
   
4. M. Jalochowski, M. Hoffmann, and E. Bauer, Phys. Rev. Lett. 76, 4227 (1996).
   
5. G. Fischer and H. Hoffmann, Z. Phys. B 39, 287 (1980).
   
6. Zhenyu Zhang, Qian Niu, and Chih-Kang Shih, Phys. Rev. Lett. 80, 5381 (1998).
   
7. B.N.J. Persson, Sliding Friction (Springer, Berlin, 1998).
   
8. H. Burghgraef, A.P.J. Jansen, and R.A. van Santen, Chem. Phys. 177, 407 (1993). [INSPEC]
   
9. O. Krauth, G. Fahsold, N. Magg, and A. Pucci (unpublished).
   
10. O. Krauth, G. Fahsold, and A. Lehmann, Surf. Sci. 433-435, 79 (1999). [INSPEC]
    
11. N. W. Ashcroft and N. D. Mermin, Solid State Physics (Holt-Saunders International Editions, New York, 1976).
    
12. F. Abeles, in Optical Properties of Solids, edited by F. Abeles (Elsevier, Amsterdam, 1972).
    
13. R. Lenk and A. Knäbchen, J. Phys.: Condens. Matter 5, 6563 (1993). [INSPEC]
    
14. H. Ishida, Phys. Rev. B 52, 10 819 (1995).
    
15. H. Hoffmann and J. Vancea, Thin Solid Films 85, 147 (1981). [INSPEC]
    
16. C. Hanewinkel, H. Winkes, D. Schumacher, and A. Otto, Electrochim. Acta 42, 3345 (1997) (ScienceDirect).
    
17. A. Liebsch Phys. Rev. B 55, 13 263 (1997).
    
18. M. Hein and D. Schumacher, J. Phys. D 28, 1937 (1995). [INSPEC]
    
19. K.C. Lin, R.G. Tobin, P. Dumas, C.J. Hirschmugl, and G.P. Williams, Phys. Rev. B 48, 2791 (1993).
    
20. G. Fahsold, J. Solbrig, and A. Lehmann, Appl. Surf. Sci. 142, 253 (1999). [INSPEC]
    
21. N. Trivedi and N.W. Ashcroft, Phys. Rev. B 38, 12 298 (1988).
    
22. P. Feibelmann, Phys. Rev. B 27, 1991 (1983).
    
23. J. Barnas and Y. Bruynseraede, Solid State Commun. 102, 843 (1997) (ScienceDirect). [INSPEC]
    
24. W. Chu Huang and Juh Tzeng Lue, Phys. Rev. B 49, 17 279 (1994).
    
25. A.K. Green, J. Dancy, and E. Bauer, J. Vac. Sci. Technol. 7, 159 (1969).
    
26. M. Meunier and C.R. Henry, Surf. Sci. 307, 514 (1994). [INSPEC]
    
27. S. Berthier and J. Peiro, J. Phys. III 7, 537 (1997). [INSPEC]
    
28. J.B. Zhou and T. Gustafsson, Surf. Sci. 375, 221 (1997) (ScienceDirect). [INSPEC]
    
29. P. Starzetz, G. Fahsold, and A. Pucci (private communication).
    
30. G. Fahsold, A. Pucci, and K.-H. Rieder, Phys. Rev. B 61, 8475 (2000).
    
31. J.F. Lawler, R. Schad, S. Jordan, and H. van Kempen, J. Magn. Magn. Mater. 165, 224 (1997) (ScienceDirect). [INSPEC]
    
32. M.A. Ordal, R.J. Bell, R.W. Alexander, Jr., L.L. Long, and M.R. Querry, Appl. Opt. 24, 4493 (1985). [SPIN]
    
33. L. Genzel and U. Kreibig, Z. Phys. B 37, 93 (1980). [INSPEC]
    
34. C. Young, J. Phys. Chem. Solids 30, 2765 (1969). [INSPEC]
    
35. J.B. Smith and H. Ehrenreich, Phys. Rev. B 25, 923 (1982).
    
36. K. Fuchs, Proc. Cambridge Philos. Soc. 34, 100 (1938).
    
37. Z. Teanovi, M. Jaric, and S. Maekawa, Phys. Rev. Lett. 57, 2760 (1986).
    
38. C. Kunze, Solid State Commun. 87, 359 (1993). [INSPEC]
    
39. Y. Namba, Jpn. J. Appl. Phys. 9, 1326 (1970). [INSPEC]
    
40. G. Bergmann, Phys. Rep. 107, 1 (1984). [INSPEC]
    
41. G. Fahsold, A. Priebe, N. Magg, and A. Pucci, Thin Solid Films 364, 177 (2000) (ScienceDirect). [INSPEC]
    
42. N. Magg, Diploma thesis, Universität Heidelberg, 1999.
    
43. G. Fahsold, A. Bartel, O. Krauth, and A. Lehmann, Surf. Sci. 433, 162 (1999). [INSPEC]
    
44. SCOUT-98, software package for optical spectroscopy (Soft Science, Aachen, Germany).
    
45. C.H. Shek, G.M. Lin, J.K.L. Lai, and J.L. Li, Thin Solid Films 300, 1 (1997) (ScienceDirect). [INSPEC]
    
46. C. Liu, Y. Park, and S.D. Bader, J. Magn. Magn. Mater. 111, L225 (1992). [INSPEC]
    
47. S. Berthier and K. Driss-Khodja, Physica A 157, 356 (1989). [INSPEC]
    
48. T. Yamaguchi, S. Yoshida, and A. Kinbara, Thin Solid Films 21, 173 (1974). [INSPEC]
    

  The American Physical Society is a member of CrossRef.

Citing Articles

1. In situ infrared-transmission study of vibrational and electronic properties during the formation of thin-film -FeSi₂
   Gerhard Fahsold et al., J. Appl. Phys. 91, 145 (2002)
2. Anomalous infrared transmission of adsorbates on ultrathin metal films: Fano effect near the percolation threshold
   Oliver Krauth et al., J. Chem. Phys. 113, 6330 (2000)